Application of diffuse mismatch theory to the prediction of thermal boundary resistance in thin-film high-Tc superconductors

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

Thermal boundary resistance (Rb) plays an important role in the design and performance of thin-film high-temperature superconducting devices, such as infrared detectors and optical switches, which rely upon the temperature rise of the film as the basis for their operation. Although there is general agreement on the magnitude of Rb from experimental data, there is at present no generally accepted theory capable of predicting Rb, for these films, particularly at the intermediate cryogenic temperatures where they are likely to he used. Here, the Diffuse Mismatch Model (DMM), which considers that all phonons reaching the interface between the film and substrate scatter diffusely, is applied to the calculation of Rb. The results indicate that although the DMM yields results slightly more in agreement with data than the Acoustic Mismatch Model (AMM), the experimental data lie far above the calculated values. Removing the assumptions involved in the derivation of the DMM in some cases improves the agreement with the experimental data, but additional features must be incorporated into the model to achieve quantitative agreement between theory and experiment.

Original languageEnglish (US)
Title of host publicationAmerican Society of Mechanical Engineers, Dynamic Systems and Control Division (Publication) DSC
Pages99-105
Number of pages7
Volume59
StatePublished - 1996

ASJC Scopus subject areas

  • Software
  • Mechanical Engineering

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    Phelan, P. (1996). Application of diffuse mismatch theory to the prediction of thermal boundary resistance in thin-film high-Tc superconductors. In American Society of Mechanical Engineers, Dynamic Systems and Control Division (Publication) DSC (Vol. 59, pp. 99-105)