Application of combined discrete-event simulation and optimization models in semiconductor enterprise manufacturing systems

Gary Godding, Hessam Sarjoughian, Karl Kempf

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Scopus citations

Abstract

It is a common practice to use simulation for validating different types of control and planning algorithms. However, the science of how to rigorously integrate simulation and decision models is not well understood and becomes critically important as the complexity and scale of these models increase. In our research, we have developed a methodology for integrating different types of models using a Knowledge Interchange Broker (KIB). In this paper we describe a supply-chain semiconductor application where the KIB has been used as an integral part of developing and deploying a commercial Model Predictive Control model for use in operating a multi-billion dollar supply chain. The simulation based experiments facilitated developing and validating the controller design and data automation for a real-world semiconductor manufacturing system.

Original languageEnglish (US)
Title of host publicationProceedings of the 2007 Winter Simulation Conference, WSC
Pages1729-1736
Number of pages8
DOIs
StatePublished - Dec 1 2007
Event2007 Winter Simulation Conference, WSC - Washington, DC, United States
Duration: Dec 9 2007Dec 12 2007

Publication series

NameProceedings - Winter Simulation Conference
ISSN (Print)0891-7736

Other

Other2007 Winter Simulation Conference, WSC
CountryUnited States
CityWashington, DC
Period12/9/0712/12/07

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ASJC Scopus subject areas

  • Software
  • Modeling and Simulation
  • Computer Science Applications

Cite this

Godding, G., Sarjoughian, H., & Kempf, K. (2007). Application of combined discrete-event simulation and optimization models in semiconductor enterprise manufacturing systems. In Proceedings of the 2007 Winter Simulation Conference, WSC (pp. 1729-1736). [4419796] (Proceedings - Winter Simulation Conference). https://doi.org/10.1109/WSC.2007.4419796