Application of a mode-matching technique to quantum wire transitions and discontinuities

Andreas Weisshaar, Jenifer Lary, Stephen Goodnick, Vijai K. Tripathi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

Modal expansions of the wave function and a mode-matching technique are used to calculate the transmission characteristics of semiconductor quantum wire structures assuming hard wall confinement in the transverse directions. Results for cascaded right-angle bends and periodic structures in a split-gate configuration are presented. A sharp transition to a plateau of zero conductance is observed for the double bend configuration. For periodic structures in the split-gate configuration, highly resonant behavior similar to that in tunneling resonant diodes is found. Calculated current-voltage characteristics for the case of two narrow constrictions are shown, exhibiting a region of negative differential resistance.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsMurray J. Gibson, Harold G. Craighead
Place of PublicationBellingham, WA, United States
PublisherPubl by Int Soc for Optical Engineering
Pages45-56
Number of pages12
Volume1284
ISBN (Print)0819403350
StatePublished - 1990
Externally publishedYes
EventNanostructures and Microstructure Correlation with Physical Properties of Semiconductors - San Diego, CA, USA
Duration: Mar 20 1990Mar 21 1990

Other

OtherNanostructures and Microstructure Correlation with Physical Properties of Semiconductors
CitySan Diego, CA, USA
Period3/20/903/21/90

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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  • Cite this

    Weisshaar, A., Lary, J., Goodnick, S., & Tripathi, V. K. (1990). Application of a mode-matching technique to quantum wire transitions and discontinuities. In M. J. Gibson, & H. G. Craighead (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 1284, pp. 45-56). Publ by Int Soc for Optical Engineering.