TY - JOUR
T1 - Anti-phase synchronization in microelectromechanical systems and effect of impulsive perturbations
AU - Chen, Qingfei
AU - Lai, Ying-Cheng
AU - Chae, Junseok
AU - Do, Younghae
PY - 2013/4/9
Y1 - 2013/4/9
N2 - We show that anti-phase synchronization can emerge in a pair of electrically coupled micromechanical beams. Under impulsive perturbation, desynchronization occurs, distorting the output of each beam. We derive a formula for the relaxation rate and verify it numerically. We also find that the difference between the displacements of the two beams, or the differential signal, is robustly immune to impulsive perturbation, implying that the system can effectively counter external disturbances. This can have significant applications in the development of various microscale devices, which we elaborate on using microelectromechanical resonators.
AB - We show that anti-phase synchronization can emerge in a pair of electrically coupled micromechanical beams. Under impulsive perturbation, desynchronization occurs, distorting the output of each beam. We derive a formula for the relaxation rate and verify it numerically. We also find that the difference between the displacements of the two beams, or the differential signal, is robustly immune to impulsive perturbation, implying that the system can effectively counter external disturbances. This can have significant applications in the development of various microscale devices, which we elaborate on using microelectromechanical resonators.
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U2 - 10.1103/PhysRevB.87.144304
DO - 10.1103/PhysRevB.87.144304
M3 - Article
AN - SCOPUS:84876233526
SN - 1098-0121
VL - 87
JO - Physical Review B - Condensed Matter and Materials Physics
JF - Physical Review B - Condensed Matter and Materials Physics
IS - 14
M1 - 144304
ER -