Anti-phase boundaries at the SrTiO3/Si(001) interface studied using aberration-corrected scanning transmission electron microscopy

HsinWei Wu; Toshihiro Aoki; Agham B. Posadas; Alexander A. Demkov; David Smith

doi:10.1063/1.4943135

Anti-phase boundaries at the SrTiO₃/Si(001) interface studied using aberration-corrected scanning transmission electron microscopy

HsinWei Wu, Toshihiro Aoki, Agham B. Posadas, Alexander A. Demkov, David Smith

Research output: Contribution to journal › Article › peer-review

16 Scopus citations

Abstract

In this work, the atomic structure of anti-phase boundary defects at the SrTiO₃/Si (001) interface is investigated by aberration-corrected scanning transmission electron microscopy. Atomic-resolution images reveal an abrupt SrTiO₃/Si interface with no intermediate oxide layer. Both single and double Si atomic columns("dumbbells") from different terraces of the Si(001) surface are visible at the interface. Anti-phase boundaries (APB) consisting of two adjacent TiO₂ planes in the SrTiO₃ (STO) film resulting either from Si surface steps or from the merging of crystalline domains from different surface nucleation sites are identified.

Original language	English (US)
Article number	091605
Journal	Applied Physics Letters
Volume	108
Issue number	9
DOIs	https://doi.org/10.1063/1.4943135
State	Published - Feb 29 2016

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

Access to Document

10.1063/1.4943135

Cite this

@article{544349ddbbe54b40840013b6da5f916c,

title = "Anti-phase boundaries at the SrTiO3/Si(001) interface studied using aberration-corrected scanning transmission electron microscopy",

abstract = "In this work, the atomic structure of anti-phase boundary defects at the SrTiO3/Si (001) interface is investigated by aberration-corrected scanning transmission electron microscopy. Atomic-resolution images reveal an abrupt SrTiO3/Si interface with no intermediate oxide layer. Both single and double Si atomic columns({"}dumbbells{"}) from different terraces of the Si(001) surface are visible at the interface. Anti-phase boundaries (APB) consisting of two adjacent TiO2 planes in the SrTiO3 (STO) film resulting either from Si surface steps or from the merging of crystalline domains from different surface nucleation sites are identified.",

author = "HsinWei Wu and Toshihiro Aoki and Posadas, {Agham B.} and Demkov, {Alexander A.} and David Smith",

note = "Publisher Copyright: {\textcopyright} 2016 AIP Publishing LLC.",

year = "2016",

month = feb,

day = "29",

doi = "10.1063/1.4943135",

language = "English (US)",

volume = "108",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "9",

}

TY - JOUR

T1 - Anti-phase boundaries at the SrTiO3/Si(001) interface studied using aberration-corrected scanning transmission electron microscopy

AU - Wu, HsinWei

AU - Aoki, Toshihiro

AU - Posadas, Agham B.

AU - Demkov, Alexander A.

AU - Smith, David

PY - 2016/2/29

Y1 - 2016/2/29

N2 - In this work, the atomic structure of anti-phase boundary defects at the SrTiO3/Si (001) interface is investigated by aberration-corrected scanning transmission electron microscopy. Atomic-resolution images reveal an abrupt SrTiO3/Si interface with no intermediate oxide layer. Both single and double Si atomic columns("dumbbells") from different terraces of the Si(001) surface are visible at the interface. Anti-phase boundaries (APB) consisting of two adjacent TiO2 planes in the SrTiO3 (STO) film resulting either from Si surface steps or from the merging of crystalline domains from different surface nucleation sites are identified.

AB - In this work, the atomic structure of anti-phase boundary defects at the SrTiO3/Si (001) interface is investigated by aberration-corrected scanning transmission electron microscopy. Atomic-resolution images reveal an abrupt SrTiO3/Si interface with no intermediate oxide layer. Both single and double Si atomic columns("dumbbells") from different terraces of the Si(001) surface are visible at the interface. Anti-phase boundaries (APB) consisting of two adjacent TiO2 planes in the SrTiO3 (STO) film resulting either from Si surface steps or from the merging of crystalline domains from different surface nucleation sites are identified.

UR - http://www.scopus.com/inward/record.url?scp=84960380622&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84960380622&partnerID=8YFLogxK

U2 - 10.1063/1.4943135

DO - 10.1063/1.4943135

M3 - Article

AN - SCOPUS:84960380622

SN - 0003-6951

VL - 108

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 9

M1 - 091605

ER -

Anti-phase boundaries at the SrTiO₃/Si(001) interface studied using aberration-corrected scanning transmission electron microscopy

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this