Abstract
The three coarsening mechanisms in Ge/Si(100) system: Ostwald ripening, Si interdiffusion and wetting layer consumption were discussed. It was found that Ge/Si(100) islands coarsened during in situ annealing at growth temperature. Molecular-beam epitaxy technique was used for the growth of islands of pure Ge and annealed at substrate temperatures of T = 450, 550, 600 and 650°C, with Ge coverages of 6.5, 8.0 and 9.5 monolayers.
Original language | English (US) |
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Pages (from-to) | 9583-9590 |
Number of pages | 8 |
Journal | Journal of Applied Physics |
Volume | 93 |
Issue number | 12 |
DOIs | |
State | Published - Jun 15 2003 |
ASJC Scopus subject areas
- Physics and Astronomy(all)