Angular symmetry of the ion scattering surface yield for large outerlayer relaxations

Robert Culbertson, J. H. Barrett, S. P. Withrow

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

The calculated angular dependence of the ion scattering surface yield for incidence near the [101] axis of Au(110) is investigated as a function of first layer relaxation. A reversal of the asymmetry of the angular dependence is observed for both large contractions and large expansions. This reversal results from shadowing in the ion flux distribution near atoms along the [101] row.

Original languageEnglish (US)
Pages (from-to)451-458
Number of pages8
JournalSurface Science
Volume157
Issue number2-3
DOIs
StatePublished - Jul 2 1985
Externally publishedYes

Fingerprint

ion scattering
Scattering
Ions
symmetry
contraction
incidence
asymmetry
Fluxes
Atoms
expansion
atoms
ions

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Angular symmetry of the ion scattering surface yield for large outerlayer relaxations. / Culbertson, Robert; Barrett, J. H.; Withrow, S. P.

In: Surface Science, Vol. 157, No. 2-3, 02.07.1985, p. 451-458.

Research output: Contribution to journalArticle

Culbertson, Robert ; Barrett, J. H. ; Withrow, S. P. / Angular symmetry of the ion scattering surface yield for large outerlayer relaxations. In: Surface Science. 1985 ; Vol. 157, No. 2-3. pp. 451-458.
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