TY - GEN
T1 - Analytical modeling for EVM in OFDM transmitters including the effects of IIP3, I/Q imbalance, noise, AM/AM and AM/PM distortion
AU - Nassery, Afsaneh
AU - Ozev, Sule
AU - Slamani, Mustapha
PY - 2013
Y1 - 2013
N2 - In this paper, we present a method for accurately calculating the Error Vector Magnitude (EVM) of OFDM transmitters based on their IQ mismatch, IIP3, noise, AM/AM and AM/PM distortion. The effects of these impairments are correlated. Thus, modeling and analyzing them in isolation results in large errors. We derive the analytical relation of the received symbol when all types of impairments are present at once and compute EVM based on this overall relation. This method helps test engineers to compute the EVM based on already measured parameters and eliminates the need to develop and set-up EVM measurements. Simulations and hardware measurements show that this calculation can be done with less than 1% error for a large range of EVM values. This error level has been shown to be within the uncertainty bounds of EVM measurements.
AB - In this paper, we present a method for accurately calculating the Error Vector Magnitude (EVM) of OFDM transmitters based on their IQ mismatch, IIP3, noise, AM/AM and AM/PM distortion. The effects of these impairments are correlated. Thus, modeling and analyzing them in isolation results in large errors. We derive the analytical relation of the received symbol when all types of impairments are present at once and compute EVM based on this overall relation. This method helps test engineers to compute the EVM based on already measured parameters and eliminates the need to develop and set-up EVM measurements. Simulations and hardware measurements show that this calculation can be done with less than 1% error for a large range of EVM values. This error level has been shown to be within the uncertainty bounds of EVM measurements.
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U2 - 10.1109/ETS.2013.6569361
DO - 10.1109/ETS.2013.6569361
M3 - Conference contribution
AN - SCOPUS:84883337695
SN - 9781467363778
T3 - Proceedings - 2013 18th IEEE European Test Symposium, ETS 2013
BT - Proceedings - 2013 18th IEEE European Test Symposium, ETS 2013
T2 - 2013 18th IEEE European Test Symposium, ETS 2013
Y2 - 27 May 2013 through 30 May 2013
ER -