Analysis of transient behavior of vertical interconnects in stacked circuit board layers using quasi-static techniques

George Pan, Xiaojun Zhu, Barry K. Gilbert

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

The transient behavior of fuzz-button interconnects were analyzed under quasistatic assumptions. The electrostatic method was used to find the charge distribution and the distributed capacitance of the fuzz-buttons, and a quasimagnetostatic approach to calculate the inductance. A free space Green's function is formulated using image theory. A set of integral equations is established and solved by a combination of the point-matching method and Galerkin's method. Several other computational methods employed are also discussed.

Original languageEnglish (US)
Pages (from-to)521-531
Number of pages11
JournalIEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging
Volume18
Issue number3
StatePublished - Aug 1995

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Charge distribution
Galerkin methods
Computational methods
Green's function
Inductance
Integral equations
Electrostatics
Capacitance
Networks (circuits)

ASJC Scopus subject areas

  • Engineering(all)

Cite this

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abstract = "The transient behavior of fuzz-button interconnects were analyzed under quasistatic assumptions. The electrostatic method was used to find the charge distribution and the distributed capacitance of the fuzz-buttons, and a quasimagnetostatic approach to calculate the inductance. A free space Green's function is formulated using image theory. A set of integral equations is established and solved by a combination of the point-matching method and Galerkin's method. Several other computational methods employed are also discussed.",
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