Analysis of the inter-area mode phenomenon in power systems following large disturbances

Vijay Vittal, N. Bhatia, A. A. Fouad

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Scopus citations

Abstract

The authors deal with the analysis of the inter-area mode phenomenon in stressed power systems following large disturbances. The dynamic phenomenon of interest is dominated by the inertial effects and usually referred to as the inertial transient. In this phenomenon, following a large disturbance, a small group of generators close to the fault location are severely disturbed initially. As the transient progresses, the weak synchronizing forces in the system dominate. When instability occurs, it takes place as a separation of a large group of generators (including the small group severely disturbed by the fault initially) from the rest of the system. The analysis reported attempts to develop a better understanding of the problem. It is shown that the inter-area mode phenomenon could occur as a result of a nonlinear interaction of the natural modes of oscillation in the system. A procedure to predict the onset of the inter-area mode is presented.

Original languageEnglish (US)
Title of host publicationProceedings - IEEE International Symposium on Circuits and Systems
PublisherPubl by IEEE
Pages982-985
Number of pages4
Volume2
StatePublished - 1991
Externally publishedYes
Event1991 IEEE International Symposium on Circuits and Systems Part 4 (of 5) - Singapore, Singapore
Duration: Jun 11 1991Jun 14 1991

Other

Other1991 IEEE International Symposium on Circuits and Systems Part 4 (of 5)
CitySingapore, Singapore
Period6/11/916/14/91

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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  • Cite this

    Vittal, V., Bhatia, N., & Fouad, A. A. (1991). Analysis of the inter-area mode phenomenon in power systems following large disturbances. In Proceedings - IEEE International Symposium on Circuits and Systems (Vol. 2, pp. 982-985). Publ by IEEE.