Analysis of single-event transients in analog circuits

P. Adell, R. D. Schrimpf, Hugh Barnaby, R. Marec, C. Chatry, P. Calvel, C. Barillot, O. Mion

Research output: Contribution to journalArticle

118 Citations (Scopus)

Abstract

A new methodology for understanding single-event transient (SET) phenomena in analog circuits is described. Device and circuit simulation techniques are coupled in order to reproduce experimental data obtained from the National Semiconductor LM124 operational amplifier and to determine the most sensitive parts of the integrated circuit. Experimental data obtained at the Physical Nuclear Institute from a low-power voltage regulator that uses the LM124 are also used to illustrate the method.

Original languageEnglish (US)
Pages (from-to)2616-2623
Number of pages8
JournalIEEE Transactions on Nuclear Science
Volume47
Issue number6 III
DOIs
StatePublished - Dec 2000
Externally publishedYes

Fingerprint

voltage regulators
operational amplifiers
analog circuits
Voltage regulators
Operational amplifiers
Circuit simulation
Analog circuits
integrated circuits
Integrated circuits
methodology
Semiconductor materials
simulation

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Nuclear Energy and Engineering

Cite this

Adell, P., Schrimpf, R. D., Barnaby, H., Marec, R., Chatry, C., Calvel, P., ... Mion, O. (2000). Analysis of single-event transients in analog circuits. IEEE Transactions on Nuclear Science, 47(6 III), 2616-2623. https://doi.org/10.1109/23.903817

Analysis of single-event transients in analog circuits. / Adell, P.; Schrimpf, R. D.; Barnaby, Hugh; Marec, R.; Chatry, C.; Calvel, P.; Barillot, C.; Mion, O.

In: IEEE Transactions on Nuclear Science, Vol. 47, No. 6 III, 12.2000, p. 2616-2623.

Research output: Contribution to journalArticle

Adell, P, Schrimpf, RD, Barnaby, H, Marec, R, Chatry, C, Calvel, P, Barillot, C & Mion, O 2000, 'Analysis of single-event transients in analog circuits', IEEE Transactions on Nuclear Science, vol. 47, no. 6 III, pp. 2616-2623. https://doi.org/10.1109/23.903817
Adell P, Schrimpf RD, Barnaby H, Marec R, Chatry C, Calvel P et al. Analysis of single-event transients in analog circuits. IEEE Transactions on Nuclear Science. 2000 Dec;47(6 III):2616-2623. https://doi.org/10.1109/23.903817
Adell, P. ; Schrimpf, R. D. ; Barnaby, Hugh ; Marec, R. ; Chatry, C. ; Calvel, P. ; Barillot, C. ; Mion, O. / Analysis of single-event transients in analog circuits. In: IEEE Transactions on Nuclear Science. 2000 ; Vol. 47, No. 6 III. pp. 2616-2623.
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