Abstract
A new methodology for understanding single-event transient (SET) phenomena in analog circuits is described. Device and circuit simulation techniques are coupled in order to reproduce experimental data obtained from the National Semiconductor LM124 operational amplifier and to determine the most sensitive parts of the integrated circuit. Experimental data obtained at the Physical Nuclear Institute from a low-power voltage regulator that uses the LM124 are also used to illustrate the method.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 2616-2623 |
| Number of pages | 8 |
| Journal | IEEE Transactions on Nuclear Science |
| Volume | 47 |
| Issue number | 6 III |
| DOIs | |
| State | Published - Dec 2000 |
| Externally published | Yes |
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ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Nuclear Energy and Engineering
Cite this
Analysis of single-event transients in analog circuits. / Adell, P.; Schrimpf, R. D.; Barnaby, Hugh; Marec, R.; Chatry, C.; Calvel, P.; Barillot, C.; Mion, O.
In: IEEE Transactions on Nuclear Science, Vol. 47, No. 6 III, 12.2000, p. 2616-2623.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Analysis of single-event transients in analog circuits
AU - Adell, P.
AU - Schrimpf, R. D.
AU - Barnaby, Hugh
AU - Marec, R.
AU - Chatry, C.
AU - Calvel, P.
AU - Barillot, C.
AU - Mion, O.
PY - 2000/12
Y1 - 2000/12
N2 - A new methodology for understanding single-event transient (SET) phenomena in analog circuits is described. Device and circuit simulation techniques are coupled in order to reproduce experimental data obtained from the National Semiconductor LM124 operational amplifier and to determine the most sensitive parts of the integrated circuit. Experimental data obtained at the Physical Nuclear Institute from a low-power voltage regulator that uses the LM124 are also used to illustrate the method.
AB - A new methodology for understanding single-event transient (SET) phenomena in analog circuits is described. Device and circuit simulation techniques are coupled in order to reproduce experimental data obtained from the National Semiconductor LM124 operational amplifier and to determine the most sensitive parts of the integrated circuit. Experimental data obtained at the Physical Nuclear Institute from a low-power voltage regulator that uses the LM124 are also used to illustrate the method.
UR - http://www.scopus.com/inward/record.url?scp=0034450421&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0034450421&partnerID=8YFLogxK
U2 - 10.1109/23.903817
DO - 10.1109/23.903817
M3 - Article
AN - SCOPUS:0034450421
VL - 47
SP - 2616
EP - 2623
JO - IEEE Transactions on Nuclear Science
JF - IEEE Transactions on Nuclear Science
SN - 0018-9499
IS - 6 III
ER -