Analysis of single-event transients in analog circuits

P. Adell, R. D. Schrimpf, H. J. Barnaby, R. Marec, C. Chatry, P. Calvel, C. Barillot, O. Mion

Research output: Contribution to journalConference article

121 Scopus citations

Abstract

A new methodology for understanding single-event transient (SET) phenomena in analog circuits is described. Device and circuit simulation techniques are coupled in order to reproduce experimental data obtained from the National Semiconductor LM124 operational amplifier and to determine the most sensitive parts of the integrated circuit. Experimental data obtained at the Physical Nuclear Institute from a low-power voltage regulator that uses the LM124 are also used to illustrate the method.

Original languageEnglish (US)
Pages (from-to)2616-2623
Number of pages8
JournalIEEE Transactions on Nuclear Science
Volume47
Issue number6 III
DOIs
StatePublished - Dec 1 2000
Externally publishedYes
Event2000 IEEE Nuclear and Space Radiation Effects Conference (NSREC) - Reno, NV, United States
Duration: Jul 24 2000Jul 28 2000

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

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    Adell, P., Schrimpf, R. D., Barnaby, H. J., Marec, R., Chatry, C., Calvel, P., Barillot, C., & Mion, O. (2000). Analysis of single-event transients in analog circuits. IEEE Transactions on Nuclear Science, 47(6 III), 2616-2623. https://doi.org/10.1109/23.903817