Abstract
A new methodology for understanding single-event transient (SET) phenomena in analog circuits is described. Device and circuit simulation techniques are coupled in order to reproduce experimental data obtained from the National Semiconductor LM124 operational amplifier and to determine the most sensitive parts of the integrated circuit. Experimental data obtained at the Physical Nuclear Institute from a low-power voltage regulator that uses the LM124 are also used to illustrate the method.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 2616-2623 |
| Number of pages | 8 |
| Journal | IEEE Transactions on Nuclear Science |
| Volume | 47 |
| Issue number | 6 III |
| DOIs | |
| State | Published - Dec 1 2000 |
| Externally published | Yes |
| Event | 2000 IEEE Nuclear and Space Radiation Effects Conference (NSREC) - Reno, NV, United States Duration: Jul 24 2000 → Jul 28 2000 |
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- Nuclear Energy and Engineering
- Electrical and Electronic Engineering
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Cite this
Adell, P., Schrimpf, R. D., Barnaby, H. J., Marec, R., Chatry, C., Calvel, P., Barillot, C., & Mion, O. (2000). Analysis of single-event transients in analog circuits. IEEE Transactions on Nuclear Science, 47(6 III), 2616-2623. https://doi.org/10.1109/23.903817