Analysis of single-event transients in analog circuits

P. Adell; R. D. Schrimpf; H. J. Barnaby; R. Marec; C. Chatry; P. Calvel; C. Barillot; O. Mion

doi:10.1109/23.903817

Analysis of single-event transients in analog circuits

P. Adell, R. D. Schrimpf, H. J. Barnaby, R. Marec, C. Chatry, P. Calvel, C. Barillot, O. Mion

Research output: Contribution to journal › Conference article › peer-review

131 Scopus citations

Abstract

A new methodology for understanding single-event transient (SET) phenomena in analog circuits is described. Device and circuit simulation techniques are coupled in order to reproduce experimental data obtained from the National Semiconductor LM124 operational amplifier and to determine the most sensitive parts of the integrated circuit. Experimental data obtained at the Physical Nuclear Institute from a low-power voltage regulator that uses the LM124 are also used to illustrate the method.

Original language	English (US)
Pages (from-to)	2616-2623
Number of pages	8
Journal	IEEE Transactions on Nuclear Science
Volume	47
Issue number	6 III
DOIs	https://doi.org/10.1109/23.903817
State	Published - Dec 2000
Externally published	Yes
Event	2000 IEEE Nuclear and Space Radiation Effects Conference (NSREC) - Reno, NV, United States Duration: Jul 24 2000 → Jul 28 2000

ASJC Scopus subject areas

Nuclear and High Energy Physics
Nuclear Energy and Engineering
Electrical and Electronic Engineering

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10.1109/23.903817

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title = "Analysis of single-event transients in analog circuits",

abstract = "A new methodology for understanding single-event transient (SET) phenomena in analog circuits is described. Device and circuit simulation techniques are coupled in order to reproduce experimental data obtained from the National Semiconductor LM124 operational amplifier and to determine the most sensitive parts of the integrated circuit. Experimental data obtained at the Physical Nuclear Institute from a low-power voltage regulator that uses the LM124 are also used to illustrate the method.",

author = "P. Adell and Schrimpf, {R. D.} and Barnaby, {H. J.} and R. Marec and C. Chatry and P. Calvel and C. Barillot and O. Mion",

note = "Funding Information: Manuscript received July 25, 2000. This work was supported in part by Al-catel Space Industries. P. Adell, R. Schrimpf, and H. Barnaby are with the Department of EECS, Vanderbilt University, Nashville, TN 37232 USA (e-mail: ron.schrimpf@vanderbilt.edu). R. Marec, P. Calvel, C. Barillot, and O. Mion are with Alcatel Space Industries, Toulouse, France (e-mail: ronan.marec@space.alcatel.fr). C. Chatry is with TRAD, Tests and Radiation, Toulouse, France (e-mail: trad@attglobal.net). Publisher Item Identifier S 0018-9499(00)11186-4. Copyright: Copyright 2008 Elsevier B.V., All rights reserved.; 2000 IEEE Nuclear and Space Radiation Effects Conference (NSREC) ; Conference date: 24-07-2000 Through 28-07-2000",

year = "2000",

month = dec,

doi = "10.1109/23.903817",

language = "English (US)",

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T1 - Analysis of single-event transients in analog circuits

AU - Adell, P.

AU - Schrimpf, R. D.

AU - Barnaby, H. J.

AU - Marec, R.

AU - Chatry, C.

AU - Calvel, P.

AU - Barillot, C.

AU - Mion, O.

N1 - Funding Information: Manuscript received July 25, 2000. This work was supported in part by Al-catel Space Industries. P. Adell, R. Schrimpf, and H. Barnaby are with the Department of EECS, Vanderbilt University, Nashville, TN 37232 USA (e-mail: ron.schrimpf@vanderbilt.edu). R. Marec, P. Calvel, C. Barillot, and O. Mion are with Alcatel Space Industries, Toulouse, France (e-mail: ronan.marec@space.alcatel.fr). C. Chatry is with TRAD, Tests and Radiation, Toulouse, France (e-mail: trad@attglobal.net). Publisher Item Identifier S 0018-9499(00)11186-4. Copyright: Copyright 2008 Elsevier B.V., All rights reserved.

PY - 2000/12

Y1 - 2000/12

N2 - A new methodology for understanding single-event transient (SET) phenomena in analog circuits is described. Device and circuit simulation techniques are coupled in order to reproduce experimental data obtained from the National Semiconductor LM124 operational amplifier and to determine the most sensitive parts of the integrated circuit. Experimental data obtained at the Physical Nuclear Institute from a low-power voltage regulator that uses the LM124 are also used to illustrate the method.

AB - A new methodology for understanding single-event transient (SET) phenomena in analog circuits is described. Device and circuit simulation techniques are coupled in order to reproduce experimental data obtained from the National Semiconductor LM124 operational amplifier and to determine the most sensitive parts of the integrated circuit. Experimental data obtained at the Physical Nuclear Institute from a low-power voltage regulator that uses the LM124 are also used to illustrate the method.

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Y2 - 24 July 2000 through 28 July 2000

ER -

Analysis of single-event transients in analog circuits

Abstract

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