Analysis of periodic dislocation networks using x-ray diffraction and extended finite element modeling

E. Wintersberger, N. Hrauda, D. Kriegner, M. Keplinger, G. Springholz, J. Stangl, G. Bauer, J. Oswald, T. Belytschko, C. Deiter, F. Bertram, O. H. Seeck

Research output: Contribution to journalArticle

12 Scopus citations

Abstract

We combine the extended finite element method with simulations of diffracted x-ray intensities to investigate the diffusely scattered intensity due to dislocations. As a model system a thin PbSe epitaxial layer grown on top of a PbTe buffer on a CdTe substrate was chosen. The PbSe film shows a periodic dislocation network where the dislocations run along the orthogonal 〈 110 〉 directions. The array of dislocations within this layer can be described by a short range order model with a narrow distribution.

Original languageEnglish (US)
Article number131905
JournalApplied Physics Letters
Volume96
Issue number13
DOIs
StatePublished - Apr 12 2010
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Fingerprint Dive into the research topics of 'Analysis of periodic dislocation networks using x-ray diffraction and extended finite element modeling'. Together they form a unique fingerprint.

  • Cite this

    Wintersberger, E., Hrauda, N., Kriegner, D., Keplinger, M., Springholz, G., Stangl, J., Bauer, G., Oswald, J., Belytschko, T., Deiter, C., Bertram, F., & Seeck, O. H. (2010). Analysis of periodic dislocation networks using x-ray diffraction and extended finite element modeling. Applied Physics Letters, 96(13), [131905]. https://doi.org/10.1063/1.3379298