Analysis of periodic dislocation networks using x-ray diffraction and extended finite element modeling

E. Wintersberger; N. Hrauda; D. Kriegner; M. Keplinger; G. Springholz; J. Stangl; G. Bauer; J. Oswald; T. Belytschko; C. Deiter; F. Bertram; O. H. Seeck

doi:10.1063/1.3379298

Analysis of periodic dislocation networks using x-ray diffraction and extended finite element modeling

E. Wintersberger, N. Hrauda, D. Kriegner, M. Keplinger, G. Springholz, J. Stangl, G. Bauer, J. Oswald, T. Belytschko, C. Deiter, F. Bertram, O. H. Seeck

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16 Scopus citations

Abstract

We combine the extended finite element method with simulations of diffracted x-ray intensities to investigate the diffusely scattered intensity due to dislocations. As a model system a thin PbSe epitaxial layer grown on top of a PbTe buffer on a CdTe substrate was chosen. The PbSe film shows a periodic dislocation network where the dislocations run along the orthogonal 〈 110 〉 directions. The array of dislocations within this layer can be described by a short range order model with a narrow distribution.

Original language	English (US)
Article number	131905
Journal	Applied Physics Letters
Volume	96
Issue number	13
DOIs	https://doi.org/10.1063/1.3379298
State	Published - 2010
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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title = "Analysis of periodic dislocation networks using x-ray diffraction and extended finite element modeling",

abstract = "We combine the extended finite element method with simulations of diffracted x-ray intensities to investigate the diffusely scattered intensity due to dislocations. As a model system a thin PbSe epitaxial layer grown on top of a PbTe buffer on a CdTe substrate was chosen. The PbSe film shows a periodic dislocation network where the dislocations run along the orthogonal 〈 110 〉 directions. The array of dislocations within this layer can be described by a short range order model with a narrow distribution.",

author = "E. Wintersberger and N. Hrauda and D. Kriegner and M. Keplinger and G. Springholz and J. Stangl and G. Bauer and J. Oswald and T. Belytschko and C. Deiter and F. Bertram and Seeck, {O. H.}",

note = "Funding Information: Work was supported by FWF, Vienna (Grant No. P18125000), EC, Brussels (Grant No. II-20060180 EC).",

year = "2010",

doi = "10.1063/1.3379298",

language = "English (US)",

volume = "96",

journal = "Applied Physics Letters",

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TY - JOUR

T1 - Analysis of periodic dislocation networks using x-ray diffraction and extended finite element modeling

AU - Wintersberger, E.

AU - Hrauda, N.

AU - Kriegner, D.

AU - Keplinger, M.

AU - Springholz, G.

AU - Stangl, J.

AU - Bauer, G.

AU - Oswald, J.

AU - Belytschko, T.

AU - Deiter, C.

AU - Bertram, F.

AU - Seeck, O. H.

N1 - Funding Information: Work was supported by FWF, Vienna (Grant No. P18125000), EC, Brussels (Grant No. II-20060180 EC).

PY - 2010

Y1 - 2010

N2 - We combine the extended finite element method with simulations of diffracted x-ray intensities to investigate the diffusely scattered intensity due to dislocations. As a model system a thin PbSe epitaxial layer grown on top of a PbTe buffer on a CdTe substrate was chosen. The PbSe film shows a periodic dislocation network where the dislocations run along the orthogonal 〈 110 〉 directions. The array of dislocations within this layer can be described by a short range order model with a narrow distribution.

AB - We combine the extended finite element method with simulations of diffracted x-ray intensities to investigate the diffusely scattered intensity due to dislocations. As a model system a thin PbSe epitaxial layer grown on top of a PbTe buffer on a CdTe substrate was chosen. The PbSe film shows a periodic dislocation network where the dislocations run along the orthogonal 〈 110 〉 directions. The array of dislocations within this layer can be described by a short range order model with a narrow distribution.

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JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 13

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ER -

Analysis of periodic dislocation networks using x-ray diffraction and extended finite element modeling

Abstract

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