Analysis of nanostructures with scanning transmission electron microscopy

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)304-305
Number of pages2
JournalMicroscopy and Microanalysis
Volume9
Issue numberSUPPL. 2
StatePublished - 2003

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Nanostructures
Transmission electron microscopy
transmission electron microscopy
Scanning electron microscopy
scanning electron microscopy

ASJC Scopus subject areas

  • Instrumentation

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Analysis of nanostructures with scanning transmission electron microscopy. / Crozier, Peter.

In: Microscopy and Microanalysis, Vol. 9, No. SUPPL. 2, 2003, p. 304-305.

Research output: Contribution to journalArticle

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