Analysis of a customer demand driven semiconductor supply chain in a distributed simulation test bed

Chin Soon Chong, Peter Lendermann, Boon Ping Gan, Brett Marc Duarte, John Fowler, Thomas E. Callarman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

Effective supply chain management (SCM) enables organizations to be more competitive in the current world of global manufacturing by reducing costs and improving the quality of customer service. Simulation can assist in moving towards these goals by evaluating the feasibility of alternative policies for managing a supply chain. However, simulation of multiple factories within the supply chain, with a high level of granularity in particular, can be very complex and computationally intensive. In this paper, we describe how a distributed simulation test bed enabling very detailed supply chain simulation can be used to study a customer-demand driven semiconductor supply chain.

Original languageEnglish (US)
Title of host publicationProceedings - Winter Simulation Conference
EditorsR.G. Ingalls, M.D. Rossetti, J.S. Smith, B.A. Peters
Pages1902-1908
Number of pages7
Volume2
StatePublished - 2004
EventProceedings of the 2004 Winter Simulation Conference - Washington, DC, United States
Duration: Dec 5 2004Dec 8 2004

Other

OtherProceedings of the 2004 Winter Simulation Conference
CountryUnited States
CityWashington, DC
Period12/5/0412/8/04

Fingerprint

Supply chains
Semiconductor materials
Supply chain management
Industrial plants
Costs

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Chong, C. S., Lendermann, P., Gan, B. P., Duarte, B. M., Fowler, J., & Callarman, T. E. (2004). Analysis of a customer demand driven semiconductor supply chain in a distributed simulation test bed. In R. G. Ingalls, M. D. Rossetti, J. S. Smith, & B. A. Peters (Eds.), Proceedings - Winter Simulation Conference (Vol. 2, pp. 1902-1908)

Analysis of a customer demand driven semiconductor supply chain in a distributed simulation test bed. / Chong, Chin Soon; Lendermann, Peter; Gan, Boon Ping; Duarte, Brett Marc; Fowler, John; Callarman, Thomas E.

Proceedings - Winter Simulation Conference. ed. / R.G. Ingalls; M.D. Rossetti; J.S. Smith; B.A. Peters. Vol. 2 2004. p. 1902-1908.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Chong, CS, Lendermann, P, Gan, BP, Duarte, BM, Fowler, J & Callarman, TE 2004, Analysis of a customer demand driven semiconductor supply chain in a distributed simulation test bed. in RG Ingalls, MD Rossetti, JS Smith & BA Peters (eds), Proceedings - Winter Simulation Conference. vol. 2, pp. 1902-1908, Proceedings of the 2004 Winter Simulation Conference, Washington, DC, United States, 12/5/04.
Chong CS, Lendermann P, Gan BP, Duarte BM, Fowler J, Callarman TE. Analysis of a customer demand driven semiconductor supply chain in a distributed simulation test bed. In Ingalls RG, Rossetti MD, Smith JS, Peters BA, editors, Proceedings - Winter Simulation Conference. Vol. 2. 2004. p. 1902-1908
Chong, Chin Soon ; Lendermann, Peter ; Gan, Boon Ping ; Duarte, Brett Marc ; Fowler, John ; Callarman, Thomas E. / Analysis of a customer demand driven semiconductor supply chain in a distributed simulation test bed. Proceedings - Winter Simulation Conference. editor / R.G. Ingalls ; M.D. Rossetti ; J.S. Smith ; B.A. Peters. Vol. 2 2004. pp. 1902-1908
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