Analysis and mitigation of electromigration in RF Circuits: An LNA case study

Ramachandran Venkatasubramanian, Doohwang Chang, Sule Ozev

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Scopus citations

Fingerprint

Dive into the research topics of 'Analysis and mitigation of electromigration in RF Circuits: An LNA case study'. Together they form a unique fingerprint.

Engineering & Materials Science