Abstract
This paper presents a digitally controlled programmable point-of-load regulator for next-generation power systems. A novel digital control scheme was designed to minimize single-event effect (SEE)-induced transient effects. By effectively programming the loop transmission, the POL can trade off transient response time with SET robustness. The IC works with 1 to 5.5 V input voltage, 1-4.5V regulated output voltage, high efficiency (peak efficiency at 94%) and power of up to 5 W. The design was fabricated in the AMI i2t100 0.7 μm complimentary, metal-oxide semiconductor (CMOS) process and characterized with the Jet Propulsion Laboratory (JPL) pulsed laser system.
Original language | English (US) |
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Article number | 6092518 |
Pages (from-to) | 3011-3017 |
Number of pages | 7 |
Journal | IEEE Transactions on Nuclear Science |
Volume | 58 |
Issue number | 6 PART 1 |
DOIs | |
State | Published - Dec 2011 |
Keywords
- Digital control
- power distribution
- radiation hardening
- single event transients (SETs)
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- Nuclear Energy and Engineering
- Electrical and Electronic Engineering