An on-chip system to monitor the pH of cell culture media

Sahil Shah, Hany Arafa, Jennifer Blain Christen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

We presents an ion sensitive field effect transistor to measure the pH of the cell culture media of human mammary adenocarcinoma (SKBR3). We use a drift mitigation technique that cycles the transistor to reset the drift in the system. We use to technique in the system to demonstrate an integrated system to monitor the pH continuously. As a part of the system a pulse width modulation circuit is designed in a 0.5 μm CMOS process which cycles the vertical electric field of the ion sensitive field effect transistor to reset the threshold voltage drift. We demonstrate the viability of a complete integrated system implementing our drift mitigation technique to monitor cultured cells. The integration is important in this application to allow for autonomous operation inside an incubator during cell culture.

Original languageEnglish (US)
Title of host publication2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2745-2748
Number of pages4
ISBN (Print)9781424479290
DOIs
StatePublished - Nov 2 2014
Event2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2014 - Chicago, United States
Duration: Aug 26 2014Aug 30 2014

Other

Other2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2014
CountryUnited States
CityChicago
Period8/26/148/30/14

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ASJC Scopus subject areas

  • Health Informatics
  • Computer Science Applications
  • Biomedical Engineering

Cite this

Shah, S., Arafa, H., & Blain Christen, J. (2014). An on-chip system to monitor the pH of cell culture media. In 2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2014 (pp. 2745-2748). [6944191] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EMBC.2014.6944191