An indirect impedance characterization method for monolithic THz antennas

Kagan Topalli; Georgios C. Trichopoulos; Kubilay Sertel

doi:10.1109/APS.2011.5996866

An indirect impedance characterization method for monolithic THz antennas

Kagan Topalli, Georgios C. Trichopoulos, Kubilay Sertel

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Scopus citations

Abstract

We present an impedance characterization method for THz antennas using coplanar probe measurements. The antenna structure, which is typically monolithically integrated with detector diodes, is represented as a two-port network. The impedance seen by the diode can be analytically extracted using reflection coefficient measurements from the other remote location of the antenna. The diode port is replaced with three terminations (short, open, and a resistive load) and measured S₁₁ data is used to compute the impedance seen by the diode. The results show that the approach gives an accurate estimate of the antenna impedance except when the electrical length between two ports is near a multiple of one-half wavelength.

Original language	English (US)
Title of host publication	2011 IEEE International Symposium on Antennas and Propagation - Proceedings
Pages	1882-1884
Number of pages	3
DOIs	https://doi.org/10.1109/APS.2011.5996866
State	Published - Nov 1 2011
Externally published	Yes
Event	2011 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI 2011 - Spokane, WA, United States Duration: Jul 3 2011 → Jul 8 2011

Publication series

Name	IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)
ISSN (Print)	1522-3965

Other

Other	2011 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI 2011
Country/Territory	United States
City	Spokane, WA
Period	7/3/11 → 7/8/11

Keywords

Antenna measurements
Terahertz detectors
focal plane arrays
scattering parameters

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/APS.2011.5996866

Cite this

An indirect impedance characterization method for monolithic THz antennas. / Topalli, Kagan; Trichopoulos, Georgios C.; Sertel, Kubilay.
2011 IEEE International Symposium on Antennas and Propagation - Proceedings. 2011. p. 1882-1884 5996866 (IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Topalli, K, Trichopoulos, GC & Sertel, K 2011, An indirect impedance characterization method for monolithic THz antennas. in 2011 IEEE International Symposium on Antennas and Propagation - Proceedings., 5996866, IEEE Antennas and Propagation Society, AP-S International Symposium (Digest), pp. 1882-1884, 2011 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI 2011, Spokane, WA, United States, 7/3/11. https://doi.org/10.1109/APS.2011.5996866

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title = "An indirect impedance characterization method for monolithic THz antennas",

abstract = "We present an impedance characterization method for THz antennas using coplanar probe measurements. The antenna structure, which is typically monolithically integrated with detector diodes, is represented as a two-port network. The impedance seen by the diode can be analytically extracted using reflection coefficient measurements from the other remote location of the antenna. The diode port is replaced with three terminations (short, open, and a resistive load) and measured S11 data is used to compute the impedance seen by the diode. The results show that the approach gives an accurate estimate of the antenna impedance except when the electrical length between two ports is near a multiple of one-half wavelength.",

keywords = "Antenna measurements, Terahertz detectors, focal plane arrays, scattering parameters",

author = "Kagan Topalli and Trichopoulos, {Georgios C.} and Kubilay Sertel",

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AU - Topalli, Kagan

AU - Trichopoulos, Georgios C.

AU - Sertel, Kubilay

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N2 - We present an impedance characterization method for THz antennas using coplanar probe measurements. The antenna structure, which is typically monolithically integrated with detector diodes, is represented as a two-port network. The impedance seen by the diode can be analytically extracted using reflection coefficient measurements from the other remote location of the antenna. The diode port is replaced with three terminations (short, open, and a resistive load) and measured S11 data is used to compute the impedance seen by the diode. The results show that the approach gives an accurate estimate of the antenna impedance except when the electrical length between two ports is near a multiple of one-half wavelength.

AB - We present an impedance characterization method for THz antennas using coplanar probe measurements. The antenna structure, which is typically monolithically integrated with detector diodes, is represented as a two-port network. The impedance seen by the diode can be analytically extracted using reflection coefficient measurements from the other remote location of the antenna. The diode port is replaced with three terminations (short, open, and a resistive load) and measured S11 data is used to compute the impedance seen by the diode. The results show that the approach gives an accurate estimate of the antenna impedance except when the electrical length between two ports is near a multiple of one-half wavelength.

KW - Antenna measurements

KW - Terahertz detectors

KW - focal plane arrays

KW - scattering parameters

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An indirect impedance characterization method for monolithic THz antennas

Abstract

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Keywords

ASJC Scopus subject areas

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