An indirect impedance characterization method for monolithic THz antennas

Kagan Topalli, Georgios Trichopoulos, Kubilay Sertel

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

We present an impedance characterization method for THz antennas using coplanar probe measurements. The antenna structure, which is typically monolithically integrated with detector diodes, is represented as a two-port network. The impedance seen by the diode can be analytically extracted using reflection coefficient measurements from the other remote location of the antenna. The diode port is replaced with three terminations (short, open, and a resistive load) and measured S11 data is used to compute the impedance seen by the diode. The results show that the approach gives an accurate estimate of the antenna impedance except when the electrical length between two ports is near a multiple of one-half wavelength.

Original languageEnglish (US)
Title of host publicationIEEE Antennas and Propagation Society, AP-S International Symposium (Digest)
Pages1882-1884
Number of pages3
DOIs
StatePublished - 2011
Externally publishedYes
Event2011 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI 2011 - Spokane, WA, United States
Duration: Jul 3 2011Jul 8 2011

Other

Other2011 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI 2011
CountryUnited States
CitySpokane, WA
Period7/3/117/8/11

Fingerprint

Diodes
Antennas
Detectors
Wavelength

Keywords

  • Antenna measurements
  • focal plane arrays
  • scattering parameters
  • Terahertz detectors

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Topalli, K., Trichopoulos, G., & Sertel, K. (2011). An indirect impedance characterization method for monolithic THz antennas. In IEEE Antennas and Propagation Society, AP-S International Symposium (Digest) (pp. 1882-1884). [5996866] https://doi.org/10.1109/APS.2011.5996866

An indirect impedance characterization method for monolithic THz antennas. / Topalli, Kagan; Trichopoulos, Georgios; Sertel, Kubilay.

IEEE Antennas and Propagation Society, AP-S International Symposium (Digest). 2011. p. 1882-1884 5996866.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Topalli, K, Trichopoulos, G & Sertel, K 2011, An indirect impedance characterization method for monolithic THz antennas. in IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)., 5996866, pp. 1882-1884, 2011 IEEE International Symposium on Antennas and Propagation and USNC/URSI National Radio Science Meeting, APSURSI 2011, Spokane, WA, United States, 7/3/11. https://doi.org/10.1109/APS.2011.5996866
Topalli K, Trichopoulos G, Sertel K. An indirect impedance characterization method for monolithic THz antennas. In IEEE Antennas and Propagation Society, AP-S International Symposium (Digest). 2011. p. 1882-1884. 5996866 https://doi.org/10.1109/APS.2011.5996866
Topalli, Kagan ; Trichopoulos, Georgios ; Sertel, Kubilay. / An indirect impedance characterization method for monolithic THz antennas. IEEE Antennas and Propagation Society, AP-S International Symposium (Digest). 2011. pp. 1882-1884
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