Abstract
This paper presents recent advances in modeling dislocations in complex geometries, anisotropic materials, and material interfaces with the extended finite element method. In this method, dislocations are modeled as discontinuities in the displacement field imposed over glide surfaces. The discontinuities are explicitly included in the simulation in the form of discontinuous enrichment functions using the extended finite element method. Several examples, including simulations of dislocation networks in quantum dots and thin films, are presented to show the effectiveness of this method for problems relevant to the analysis of dislocation formation in nano- and micro-electronic devices.
| Original language | English (US) |
|---|---|
| Title of host publication | IMAPS International Conference and Exhibition on Device Packaging, DPC 2012 - In Conjunction with the Global Business Council, GBC 2012 Spring Conference |
| Pages | 308-311 |
| Number of pages | 4 |
| State | Published - 2012 |
| Event | 8th Annual IMAPS International Conference and Exhibition on Device Packaging, DPC 2012 - In Conjunction with the Global Business Council, GBC 2012 Spring Conference - Scottsdale/Fountain Hills, AZ, United States Duration: Mar 5 2012 → Mar 8 2012 |
Other
| Other | 8th Annual IMAPS International Conference and Exhibition on Device Packaging, DPC 2012 - In Conjunction with the Global Business Council, GBC 2012 Spring Conference |
|---|---|
| Country/Territory | United States |
| City | Scottsdale/Fountain Hills, AZ |
| Period | 3/5/12 → 3/8/12 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials