An extended finite element method for dislocations in complex geometries: Thin films and nanotubes

Jay Oswald, Robert Gracie, Roopam Khare, Ted Belytschko

Research output: Contribution to journalArticle

33 Scopus citations

Abstract

Dislocation models based on the extended finite element method (XFEM) are developed for thin shells such as carbon nanotubes (CNTs) and thin films. In shells, methods for edge dislocations, which move by glide, and prismatic dislocations, which move by climb, are described. In thin films, methods for dislocations with edge, screw and/or prismatic character are developed in three dimensions. Singular enrichments are proposed which allow the Peach-Koehler force to be computed directly from the stress field along the dislocation line and give improved accuracy.

Original languageEnglish (US)
Pages (from-to)1872-1886
Number of pages15
JournalComputer Methods in Applied Mechanics and Engineering
Volume198
Issue number21-26
DOIs
StatePublished - May 1 2009
Externally publishedYes

Keywords

  • Carbon nanotubes
  • Dislocations
  • Extended finite element method
  • Thin films
  • Thin shells

ASJC Scopus subject areas

  • Computational Mechanics
  • Mechanics of Materials
  • Mechanical Engineering
  • Physics and Astronomy(all)
  • Computer Science Applications

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