An Atomic Level Study of Local Strain Fields on Multiple Low-index Ceria (CeO2) Nanoparticle Surfaces

An Atomic Level Study of Local Strain Fields on Multiple Low-index Ceria (CeO₂) Nanoparticle Surfaces

Piyush Haluai, Ethan Lawrence, Barnaby Levin, Peter Crozier

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Article number	443
Journal	Microscopy and Microanalysis
DOIs	https://doi.org/10.1017/S1431927620017109
State	Accepted/In press - 2020

@article{0e03e247bb2d40049d5023047dc77f9c,

title = "An Atomic Level Study of Local Strain Fields on Multiple Low-index Ceria (CeO2) Nanoparticle Surfaces",

author = "Piyush Haluai and Ethan Lawrence and Barnaby Levin and Peter Crozier",

year = "2020",

doi = "10.1017/S1431927620017109",

language = "English (US)",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

}

TY - JOUR

T1 - An Atomic Level Study of Local Strain Fields on Multiple Low-index Ceria (CeO2) Nanoparticle Surfaces

AU - Haluai, Piyush

AU - Lawrence, Ethan

AU - Levin, Barnaby

AU - Crozier, Peter

PY - 2020

Y1 - 2020

UR - http://www.scopus.com/inward/record.url?scp=85091852746&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85091852746&partnerID=8YFLogxK

U2 - 10.1017/S1431927620017109

DO - 10.1017/S1431927620017109

M3 - Article

AN - SCOPUS:85091852746

SN - 1431-9276

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

M1 - 443

ER -