An analytical technique for characterization of transceiver IQ imbalances in the loop-back mode

Afsaneh Nassery, Sule Ozev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

22 Scopus citations

Abstract

Loop-back is a desirable test set-up for RF transceivers for both on-chip characterization and production testing. Measurement of IQ imbalances (phase mismatch, gain mismatch, DC offset, and time skews) in the loop-back mode is challenging due to the coupling between the receiver (RX) and transmitter (TX) parameters. We present an analytical method for the measurement of the imbalances in the loop-back mode. We excite the system with carefully designed test signals at the baseband TX input and analyze the corresponding RX baseband output. The derived and used mathematical equations based on these test inputs enable us to unambiguously compute IQ mismatches. Experiments conducted both in simulations and on a hardware platform confirm that the proposed technique can accurately compute the IQ imbalances.

Original languageEnglish (US)
Title of host publicationProceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 2012
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1084-1089
Number of pages6
ISBN (Print)9783981080186
DOIs
StatePublished - 2012
Event15th Design, Automation and Test in Europe Conference and Exhibition, DATE 2012 - Dresden, Germany
Duration: Mar 12 2012Mar 16 2012

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
ISSN (Print)1530-1591

Other

Other15th Design, Automation and Test in Europe Conference and Exhibition, DATE 2012
CountryGermany
CityDresden
Period3/12/123/16/12

ASJC Scopus subject areas

  • Engineering(all)

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