An analytical approach to efficient circuit variability analysis in scaled CMOS design

Samatha Gummalla, Anupama R. Subramaniam, Yu Cao, Chaitali Chakrabarti

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Scopus citations

Abstract

CMOS scaling has led to increasingly high variability in device and circuit performance. To improve design robustness, it is important to consider variation in the design flow. In this paper a closed-form solution is proposed to predict the variability in gate timing, which significantly reduces computation cost in statistical analysis. The proposed model covers both nominal delay and its variability across a wide range of device sizes, load capacitances and input transition times. Stack effect, such as that in NAND and NOR gates, is taken into account thereby making the model sensitive to the switching patterns. For ISCAS'85 benchmark circuits, implemented using a 45nm library, the model demonstrates high accuracy with less than 3.5% error for nominal delay and within 5ps variation of the critical path. Finally, use of the proposed model in design flow is demonstrated for setup time violations.

Original languageEnglish (US)
Title of host publicationProceedings of the 13th International Symposium on Quality Electronic Design, ISQED 2012
Pages641-647
Number of pages7
DOIs
StatePublished - Jul 16 2012
Event13th International Symposium on Quality Electronic Design, ISQED 2012 - Santa Clara, CA, United States
Duration: Mar 19 2012Mar 21 2012

Publication series

NameProceedings - International Symposium on Quality Electronic Design, ISQED
ISSN (Print)1948-3287
ISSN (Electronic)1948-3295

Other

Other13th International Symposium on Quality Electronic Design, ISQED 2012
CountryUnited States
CitySanta Clara, CA
Period3/19/123/21/12

Keywords

  • Timing model
  • critical path
  • statistical analysis
  • variation

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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