AMS verification in advanced technologies

Hidetoshi Onodera, Yu Cao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Verification of Analog and Mixed-Signal(AMS) circuits and systems is increasingly challenging. This session explores novel AMS simulation and emulation techniques, and advanced reliability and performance issues with technology scaling.

Original languageEnglish (US)
Title of host publicationProceedings of the IEEE 2013 Custom Integrated Circuits Conference, CICC 2013
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781467361460
DOIs
StatePublished - Nov 7 2013
Event35th Annual Custom Integrated Circuits Conference - The Showcase for Circuit Design in the Heart of Silicon Valley, CICC 2013 - San Jose, CA, United States
Duration: Sep 22 2013Sep 25 2013

Publication series

NameProceedings of the Custom Integrated Circuits Conference
ISSN (Print)0886-5930

Other

Other35th Annual Custom Integrated Circuits Conference - The Showcase for Circuit Design in the Heart of Silicon Valley, CICC 2013
CountryUnited States
CitySan Jose, CA
Period9/22/139/25/13

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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