AMS verification in advanced technologies

Hidetoshi Onodera, Yu Cao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Verification of Analog and Mixed-Signal(AMS) circuits and systems is increasingly challenging. This session explores novel AMS simulation and emulation techniques, and advanced reliability and performance issues with technology scaling.

Original languageEnglish (US)
Title of host publicationProceedings of the Custom Integrated Circuits Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781467361460
DOIs
Publication statusPublished - Nov 7 2013
Event35th Annual Custom Integrated Circuits Conference - The Showcase for Circuit Design in the Heart of Silicon Valley, CICC 2013 - San Jose, CA, United States
Duration: Sep 22 2013Sep 25 2013

Other

Other35th Annual Custom Integrated Circuits Conference - The Showcase for Circuit Design in the Heart of Silicon Valley, CICC 2013
CountryUnited States
CitySan Jose, CA
Period9/22/139/25/13

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Onodera, H., & Cao, Y. (2013). AMS verification in advanced technologies. In Proceedings of the Custom Integrated Circuits Conference [6658571] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CICC.2013.6658571