Amorphous silicon/crystalline silicon heterojunction solar cells-Analysis of lateral conduction through the inversion layer

Miha Filipic; Zachary Holman; Franc Smole; Stefaan De Wolf; Christophe Ballif; Marko Topic

doi:10.1109/MIEL.2014.6842128

Amorphous silicon/crystalline silicon heterojunction solar cells-Analysis of lateral conduction through the inversion layer

Miha Filipic, Zachary Holman, Franc Smole, Stefaan De Wolf, Christophe Ballif, Marko Topic

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

We examine the contribution of the inversion layer, present at the amorphous silicon/crystalline silicon interface, to the lateral conduction of photogenerated charge carriers. We employ numerical simulation and experiments to determine if this layer can be exploited to replace the transparent conductive oxide layer (TCO). We found that current collection is constant when the TCO is present, but carriers can only travel a few hundred μm when the TCO is omitted. Simulations predict that increasing the valence band offset increases the conductivity of the inversion layer.

Original language	English (US)
Title of host publication	2014 29th International Conference on Microelectronics, MIEL 2014 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	227-230
Number of pages	4
ISBN (Print)	9781479952960
DOIs	https://doi.org/10.1109/MIEL.2014.6842128
State	Published - Jan 1 2014
Event	2014 29th International Conference on Microelectronics, MIEL 2014 - Belgrade, Serbia Duration: May 12 2014 → May 14 2014

Publication series

Name	Proceedings of the International Conference on Microelectronics, ICM

Other

Other	2014 29th International Conference on Microelectronics, MIEL 2014
Country/Territory	Serbia
City	Belgrade
Period	5/12/14 → 5/14/14

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/MIEL.2014.6842128

Cite this

Filipic, M., Holman, Z., Smole, F., De Wolf, S., Ballif, C., & Topic, M. (2014). Amorphous silicon/crystalline silicon heterojunction solar cells-Analysis of lateral conduction through the inversion layer. In 2014 29th International Conference on Microelectronics, MIEL 2014 - Proceedings (pp. 227-230). [6842128] (Proceedings of the International Conference on Microelectronics, ICM). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MIEL.2014.6842128

Amorphous silicon/crystalline silicon heterojunction solar cells-Analysis of lateral conduction through the inversion layer. / Filipic, Miha; Holman, Zachary; Smole, Franc et al.

2014 29th International Conference on Microelectronics, MIEL 2014 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2014. p. 227-230 6842128 (Proceedings of the International Conference on Microelectronics, ICM).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Filipic, M, Holman, Z, Smole, F, De Wolf, S, Ballif, C & Topic, M 2014, Amorphous silicon/crystalline silicon heterojunction solar cells-Analysis of lateral conduction through the inversion layer. in 2014 29th International Conference on Microelectronics, MIEL 2014 - Proceedings., 6842128, Proceedings of the International Conference on Microelectronics, ICM, Institute of Electrical and Electronics Engineers Inc., pp. 227-230, 2014 29th International Conference on Microelectronics, MIEL 2014, Belgrade, Serbia, 5/12/14. https://doi.org/10.1109/MIEL.2014.6842128

Filipic M, Holman Z, Smole F, De Wolf S, Ballif C, Topic M. Amorphous silicon/crystalline silicon heterojunction solar cells-Analysis of lateral conduction through the inversion layer. In 2014 29th International Conference on Microelectronics, MIEL 2014 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2014. p. 227-230. 6842128. (Proceedings of the International Conference on Microelectronics, ICM). doi: 10.1109/MIEL.2014.6842128

Filipic, Miha ; Holman, Zachary ; Smole, Franc et al. / Amorphous silicon/crystalline silicon heterojunction solar cells-Analysis of lateral conduction through the inversion layer. 2014 29th International Conference on Microelectronics, MIEL 2014 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2014. pp. 227-230 (Proceedings of the International Conference on Microelectronics, ICM).

@inproceedings{a5b30c3f529648b785691795440a607b,

title = "Amorphous silicon/crystalline silicon heterojunction solar cells-Analysis of lateral conduction through the inversion layer",

abstract = "We examine the contribution of the inversion layer, present at the amorphous silicon/crystalline silicon interface, to the lateral conduction of photogenerated charge carriers. We employ numerical simulation and experiments to determine if this layer can be exploited to replace the transparent conductive oxide layer (TCO). We found that current collection is constant when the TCO is present, but carriers can only travel a few hundred μm when the TCO is omitted. Simulations predict that increasing the valence band offset increases the conductivity of the inversion layer.",

author = "Miha Filipic and Zachary Holman and Franc Smole and {De Wolf}, Stefaan and Christophe Ballif and Marko Topic",

year = "2014",

month = jan,

day = "1",

doi = "10.1109/MIEL.2014.6842128",

language = "English (US)",

isbn = "9781479952960",

series = "Proceedings of the International Conference on Microelectronics, ICM",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "227--230",

booktitle = "2014 29th International Conference on Microelectronics, MIEL 2014 - Proceedings",

note = "2014 29th International Conference on Microelectronics, MIEL 2014 ; Conference date: 12-05-2014 Through 14-05-2014",

}

TY - GEN

T1 - Amorphous silicon/crystalline silicon heterojunction solar cells-Analysis of lateral conduction through the inversion layer

AU - Filipic, Miha

AU - Holman, Zachary

AU - Smole, Franc

AU - De Wolf, Stefaan

AU - Ballif, Christophe

AU - Topic, Marko

PY - 2014/1/1

Y1 - 2014/1/1

N2 - We examine the contribution of the inversion layer, present at the amorphous silicon/crystalline silicon interface, to the lateral conduction of photogenerated charge carriers. We employ numerical simulation and experiments to determine if this layer can be exploited to replace the transparent conductive oxide layer (TCO). We found that current collection is constant when the TCO is present, but carriers can only travel a few hundred μm when the TCO is omitted. Simulations predict that increasing the valence band offset increases the conductivity of the inversion layer.

AB - We examine the contribution of the inversion layer, present at the amorphous silicon/crystalline silicon interface, to the lateral conduction of photogenerated charge carriers. We employ numerical simulation and experiments to determine if this layer can be exploited to replace the transparent conductive oxide layer (TCO). We found that current collection is constant when the TCO is present, but carriers can only travel a few hundred μm when the TCO is omitted. Simulations predict that increasing the valence band offset increases the conductivity of the inversion layer.

UR - http://www.scopus.com/inward/record.url?scp=84904651843&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84904651843&partnerID=8YFLogxK

U2 - 10.1109/MIEL.2014.6842128

DO - 10.1109/MIEL.2014.6842128

M3 - Conference contribution

AN - SCOPUS:84904651843

SN - 9781479952960

T3 - Proceedings of the International Conference on Microelectronics, ICM

SP - 227

EP - 230

BT - 2014 29th International Conference on Microelectronics, MIEL 2014 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2014 29th International Conference on Microelectronics, MIEL 2014

Y2 - 12 May 2014 through 14 May 2014

ER -

Amorphous silicon/crystalline silicon heterojunction solar cells-Analysis of lateral conduction through the inversion layer

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