Amorphous silicon thin-film transistor backplanes deposited at 200 °C on clear plastic for lamination to electrophoretic displays

Alex Z. Kattamis, I. Chun Cheng, Ke Long, Bahman Hekmatshoar, Kunigunde H. Cherenack, Sigurd Wagner, James C. Sturm, Sameer M. Venugopal, Douglas E. Loy, Shawn M. O'Rourke, David Allee

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