AMERICAN INSTITUTE OF INDUSTRIAL ENGINEERS, CONFERENCE AND CONVENTION, 23RD, ANNUAL, 1972.

John w. O'Leary, Roger L. Meisenbach, Warren H. Thomas, N. Richard Reeve, Rufus D. Collins, Kenneth E. Case, G. Kemble Bennett, Douglas Montgomery, Phillip J. Klatt, Larry R. Oliver, Melvin D. Springer, Prakash T. Sathe, Walton M. Hancock, Cecil G. Johnson

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

Following is the continuation of the list of titles and authors: Batching of Assembly Shop Orders. by John W. O'Leary and Roger L. Meisenbach. Balancing Continuous Stochastic Assembly Lines. By Warren H. Thomas and N. . Richard Reeve. Effect of Inspection Accuracy in Statistical Quality Control. By Rufus D. Collins, Jr. , Kenneth E. Case, and G. Kemble Bennett. Minimum Cost Multivariate Quality Control Tests. By Douglas C. Montgomery and Phillip J. Klatt. General Set of Bayesian Attribute Acceptance Plans. By Larry R. Oliver and Melvin D. Springer. Reliability Models for Maintenance Scheduling Systems. By Prakash T. Sathe and Walton M. Hancock. Redesign of the American University. By Cecil G. Johnson.

Original languageEnglish (US)
Title of host publicationUnknown Host Publication Title
Place of PublicationAtlanta, Norcross
PublisherAm Inst of Ind Eng
StatePublished - 1972
Externally publishedYes

ASJC Scopus subject areas

  • General Engineering

Fingerprint

Dive into the research topics of 'AMERICAN INSTITUTE OF INDUSTRIAL ENGINEERS, CONFERENCE AND CONVENTION, 23RD, ANNUAL, 1972.'. Together they form a unique fingerprint.

Cite this