@inproceedings{6f761695145e4b3dabc087e5f35490eb,
title = "Aging statistics based on trapping/detrapping: Silicon evidence, modeling and long-term prediction",
abstract = "The aging process due to Negative Bias Temperature Instability (NBTI) exhibits a significant amount of variability and thus poses a dramatic challenge for long-term reliability prediction from short-term stress measurement. To develop a robust prediction method in this circumstance, this work first collects statistical device data from a 65nm test chip with a resolution of 0.2mV in threshold voltage (V th) measurement. By comparing model prediction from short-term stress data (<20k second) with direct long-term measurement (up to 200k second), we conclude that (1) the degradation follows a logarithmic dependence on time, as opposed to the conventional power law; (2) the Reaction-Diffusion (R-D) based t n model significantly overestimates the aging rate and exaggerates its variance; (3) the log(t) model, derived from the trapping/de-trapping (T-D) mechanism, correctly captures the aging variability due to the randomness in number of available traps, and accurately predicts the mean and the variance of V th shift. These results guide the development of a new aging model for robust long-term lifetime prediction.",
keywords = "NBTI, Statistical degradation, long-term prediction, trapping/detrapping",
author = "Velamala, {Jyothi B.} and Sutaria, {Ketul B.} and Takashi Sato and Yu Cao",
year = "2012",
doi = "10.1109/IRPS.2012.6241795",
language = "English (US)",
isbn = "9781457716799",
series = "IEEE International Reliability Physics Symposium Proceedings",
pages = "2F.2.1--2F.2.5",
booktitle = "2012 IEEE International Reliability Physics Symposium, IRPS 2012",
note = "2012 IEEE International Reliability Physics Symposium, IRPS 2012 ; Conference date: 15-04-2012 Through 19-04-2012",
}