Aging statistics based on trapping/detrapping: Silicon evidence, modeling and long-term prediction

Jyothi B. Velamala, Ketul B. Sutaria, Takashi Sato, Yu Cao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

37 Scopus citations

Abstract

The aging process due to Negative Bias Temperature Instability (NBTI) exhibits a significant amount of variability and thus poses a dramatic challenge for long-term reliability prediction from short-term stress measurement. To develop a robust prediction method in this circumstance, this work first collects statistical device data from a 65nm test chip with a resolution of 0.2mV in threshold voltage (V th) measurement. By comparing model prediction from short-term stress data (<20k second) with direct long-term measurement (up to 200k second), we conclude that (1) the degradation follows a logarithmic dependence on time, as opposed to the conventional power law; (2) the Reaction-Diffusion (R-D) based t n model significantly overestimates the aging rate and exaggerates its variance; (3) the log(t) model, derived from the trapping/de-trapping (T-D) mechanism, correctly captures the aging variability due to the randomness in number of available traps, and accurately predicts the mean and the variance of V th shift. These results guide the development of a new aging model for robust long-term lifetime prediction.

Original languageEnglish (US)
Title of host publication2012 IEEE International Reliability Physics Symposium, IRPS 2012
Pages2F.2.1-2F.2.5
DOIs
StatePublished - Sep 28 2012
Event2012 IEEE International Reliability Physics Symposium, IRPS 2012 - Anaheim, CA, United States
Duration: Apr 15 2012Apr 19 2012

Publication series

NameIEEE International Reliability Physics Symposium Proceedings
ISSN (Print)1541-7026

Other

Other2012 IEEE International Reliability Physics Symposium, IRPS 2012
CountryUnited States
CityAnaheim, CA
Period4/15/124/19/12

Keywords

  • NBTI
  • Statistical degradation
  • long-term prediction
  • trapping/detrapping

ASJC Scopus subject areas

  • Engineering(all)

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    Velamala, J. B., Sutaria, K. B., Sato, T., & Cao, Y. (2012). Aging statistics based on trapping/detrapping: Silicon evidence, modeling and long-term prediction. In 2012 IEEE International Reliability Physics Symposium, IRPS 2012 (pp. 2F.2.1-2F.2.5). [6241795] (IEEE International Reliability Physics Symposium Proceedings). https://doi.org/10.1109/IRPS.2012.6241795