Abstract

We report the results of our study on the impact of variable atomic ratio of GexSe1-x on the total ionization dose (TID) influenced lateral diffusion of Ag into chalcogenide glasses (ChG) in flexible radiation detection sensors.

Original languageEnglish (US)
Title of host publication2016 16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-3
Number of pages3
Volume2016-September
ISBN (Electronic)9781509043668
DOIs
StatePublished - Oct 31 2017
Event16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016 - Bremen, Germany
Duration: Sep 19 2016Sep 23 2016

Other

Other16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016
CountryGermany
CityBremen
Period9/19/169/23/16

Keywords

  • atomic ratio
  • chalcogenide glass (ChG)
  • dosimetry
  • dynamic range
  • flexible radiation sensor
  • gamma rays
  • limit of detection

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Radiation

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  • Cite this

    Mahmud, A., Gonzalez Velo, Y., Taggart, J., Bamaby, H. J., Kozicki, M., Holbert, K., Mitkova, M., Alford, T., Goryll, M., & Chen, W. (2017). Ag-chalcogenide glass flexible radiation sensor: Impact of atomic ratio of Se on the TID influenced lateral diffusion of Ag. In 2016 16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016 (Vol. 2016-September, pp. 1-3). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/RADECS.2016.8093161