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Adsorption of III/v ions (In(III), Ga(III) and As(v)) onto SiO
2
, CeO
2
and Al
2
O
3
nanoparticles used in the semiconductor industry
Xiangyu Bi,
Paul Westerhoff
Water and Environmental Technology Center (WET)
Sustainable Engineering and the Built Environment, School of (IAFSE-SEBE)
Sustainability Initiative
Infrastructure and Sustainable Engineering, Metis Center for
Engineering, Ira A. Fulton Schools of (IAFSE)
Electrical Engineering
Civil and Environmental Engineering
Life Sciences, School of (SOLS)
Chemical Engineering
NSF Water Quality Center (WQC)
Research output
:
Contribution to journal
›
Article
›
peer-review
20
Scopus citations
Overview
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Dive into the research topics of 'Adsorption of III/v ions (In(III), Ga(III) and As(v)) onto SiO
2
, CeO
2
and Al
2
O
3
nanoparticles used in the semiconductor industry'. Together they form a unique fingerprint.
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Weight
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Engineering & Materials Science
SiO2 nanoparticles
100%
Cerium oxide
81%
Nanoparticles
63%
Adsorption
62%
Aluminum oxide
61%
Ions
58%
Semiconductor materials
56%
Complexation
42%
Industry
27%
Chemical mechanical polishing
25%
Specific surface area
8%
Wastewater
6%
Electronic equipment
5%
Fabrication
4%
Earth & Environmental Sciences
semiconductor industry
91%
nanoparticle
59%
adsorption
43%
ion
40%
complexation
23%
chemical
7%
aquatic system
5%
electronics
4%
material
4%
surface area
4%
plateau
3%
wastewater
3%
particle
2%
Chemical Compounds
Semiconductor
48%
Industry
47%
Nanoparticle
32%
Adsorption
31%
Ion
25%
Polishing
22%
Size Reduction
16%
Nanoparticle Size
14%
pH Value
5%
Wastewater
5%
Specific Surface Area
4%
Surface
2%