Adaptive test elimination for analog/RF circuits

Ender Yilmaz, Sule Ozev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

21 Scopus citations

Abstract

In this paper, we propose an adaptive test strategy that tailors the test sequence with respect to the properties of each individual instance of a circuit. Reducing the test set by analyzing the dropout patterns during characterization and eliminating the unnecessary tests has always been the approach for high volume production in the analog domain. However, once determined, the test set remains typically fixed for all devices. We propose to exploit the statistical diversity of the manufactured devices and adaptively eliminate tests that are determined to be unnecessary based on information obtained on the circuit under test. We compare our results with other similar specification-based test reduction techniques for an LNA circuit and observe 90% test quality improvement for the same test time or 24% test time reduction for the same test quality.

Original languageEnglish (US)
Title of host publication2009 46th ACM/IEEE Design Automation Conference, DAC 2009
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages720-725
Number of pages6
ISBN (Print)9781605584973
DOIs
StatePublished - Jan 1 2009
Event2009 46th ACM/IEEE Design Automation Conference, DAC 2009 - San Francisco, CA, United States
Duration: Jul 26 2009Jul 31 2009

Publication series

NameProceedings - Design Automation Conference
ISSN (Print)0738-100X

Other

Other2009 46th ACM/IEEE Design Automation Conference, DAC 2009
Country/TerritoryUnited States
CitySan Francisco, CA
Period7/26/097/31/09

Keywords

  • Adaptive testing

ASJC Scopus subject areas

  • Computer Science Applications
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Modeling and Simulation

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