Adaptive scenario-based object-oriented test frameworks for testing embedded systems

W. T. Tsai, Y. Na, R. Paul, F. Lu, A. Saimi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

17 Scopus citations

Abstract

This paper presents a process to develop adaptive object-oriented scenario-based test frameworks for testing embedded systems. Embedded systems often require rigorous testing due to the mission-critical nature of their applications, and they are often developed as a family of products. The process uses techniques such as design-for-change, design patterns, scenarios, ripple effect analysis, and regression testing. This paper then uses an example to illustrate this process by applying it to test a mobile phone system, and the framework constructed can facilitate generation of numerous test cases quickly with minimum effort, and it can also accommodates many changes suggested by another party without changing the overall structure of the framework.

Original languageEnglish (US)
Title of host publicationProceedings - IEEE Computer Society's International Computer Software and Applications Conference
Pages321-326
Number of pages6
StatePublished - 2002
Event26th Annual International Computer Software and Applications Conference - Oxford, United Kingdom
Duration: Aug 26 2002Aug 29 2002

Other

Other26th Annual International Computer Software and Applications Conference
CountryUnited Kingdom
CityOxford
Period8/26/028/29/02

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Keywords

  • Design patterns
  • Embedded systems
  • Object-oriented test frameworks
  • Regression testing
  • Scenarios
  • Test reusability
  • Test scenarios

ASJC Scopus subject areas

  • Software

Cite this

Tsai, W. T., Na, Y., Paul, R., Lu, F., & Saimi, A. (2002). Adaptive scenario-based object-oriented test frameworks for testing embedded systems. In Proceedings - IEEE Computer Society's International Computer Software and Applications Conference (pp. 321-326)