Abstract
This paper presents a process to develop adaptive object-oriented scenario-based test frameworks for testing embedded systems. Embedded systems often require rigorous testing due to the mission-critical nature of their applications, and they are often developed as a family of products. The process uses techniques such as design-for-change, design patterns, scenarios, ripple effect analysis, and regression testing. This paper then uses an example to illustrate this process by applying it to test a mobile phone system, and the framework constructed can facilitate generation of numerous test cases quickly with minimum effort, and it can also accommodates many changes suggested by another party without changing the overall structure of the framework.
| Original language | English (US) |
|---|---|
| Title of host publication | Proceedings - IEEE Computer Society's International Computer Software and Applications Conference |
| Pages | 321-326 |
| Number of pages | 6 |
| State | Published - 2002 |
| Event | 26th Annual International Computer Software and Applications Conference - Oxford, United Kingdom Duration: Aug 26 2002 → Aug 29 2002 |
Other
| Other | 26th Annual International Computer Software and Applications Conference |
|---|---|
| Country/Territory | United Kingdom |
| City | Oxford |
| Period | 8/26/02 → 8/29/02 |
Keywords
- Design patterns
- Embedded systems
- Object-oriented test frameworks
- Regression testing
- Scenarios
- Test reusability
- Test scenarios
ASJC Scopus subject areas
- Software