Adaptive quality binning for analog circuits

Ender Yilmaz, Sule Ozev, Kenneth M. Butler

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Manufactured devices have a diverse perfor-mance/quality profile due to process variations. Devices with superior performance and quality are of higher value while the rest can be sold for a lower price. Separating manufactured devices according to their performance is defined as quality/performance binning and is a very effective way of lowering average device cost. In this manner, devices that have below average quality are not wasted and therefore device cost is reduced. Quality binned devices share the same design and typically go through the same manufacturing process and even the same test process. After the testing step, they are binned according to different sets of performance criteria, typically according to the customer specifications. The bin a device falls depends on the process and typically does not match the amount requested by the customers because of uncertainty (variation) of the process. In this work, we present a multi-bin quality-oriented adaptive test method that efficiently classifies the devices according to the desired quality criteria and minimizes the overall test time.

Original languageEnglish (US)
Title of host publicationProceedings - 2013 18th IEEE European Test Symposium, ETS 2013
DOIs
StatePublished - 2013
Event2013 18th IEEE European Test Symposium, ETS 2013 - Avignon, France
Duration: May 27 2013May 30 2013

Other

Other2013 18th IEEE European Test Symposium, ETS 2013
CountryFrance
CityAvignon
Period5/27/135/30/13

Fingerprint

Analog circuits
Bins
Costs
Specifications
Testing
Uncertainty

ASJC Scopus subject areas

  • Software

Cite this

Yilmaz, E., Ozev, S., & Butler, K. M. (2013). Adaptive quality binning for analog circuits. In Proceedings - 2013 18th IEEE European Test Symposium, ETS 2013 [6569357] https://doi.org/10.1109/ETS.2013.6569357

Adaptive quality binning for analog circuits. / Yilmaz, Ender; Ozev, Sule; Butler, Kenneth M.

Proceedings - 2013 18th IEEE European Test Symposium, ETS 2013. 2013. 6569357.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Yilmaz, E, Ozev, S & Butler, KM 2013, Adaptive quality binning for analog circuits. in Proceedings - 2013 18th IEEE European Test Symposium, ETS 2013., 6569357, 2013 18th IEEE European Test Symposium, ETS 2013, Avignon, France, 5/27/13. https://doi.org/10.1109/ETS.2013.6569357
Yilmaz E, Ozev S, Butler KM. Adaptive quality binning for analog circuits. In Proceedings - 2013 18th IEEE European Test Symposium, ETS 2013. 2013. 6569357 https://doi.org/10.1109/ETS.2013.6569357
Yilmaz, Ender ; Ozev, Sule ; Butler, Kenneth M. / Adaptive quality binning for analog circuits. Proceedings - 2013 18th IEEE European Test Symposium, ETS 2013. 2013.
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