Adaptive multi-site testing for analog/mixed-signal circuits incorporating neighborhood information

Ender Yilmaz, Sule Ozev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

Increasing integration packs more functionality in a single chip necessitating the testing of even more specification parameters. However, there is a tendency to keep test time budged constrained, which leads test engineers to seek more efficient test strategies. Statistical test compaction methods offer generic and circuit independent means of achieving efficient testing. Adaptive test methodologies have been shown to achieve better test quality versus test time trade-off compared to non-adaptive methods. In this work, we propose a new adaptive test approach geared for multi-site applications to achieve a significantly better test time/test quality trade-off. We employ an innovative compound-device approach that enables us to exploit device-to-device correlations. Moreover, we use neighbor device statistics for efficient defect screening. We show that despite the constraints imposed by multi-site testing, we successfully reap the benefits of adaptive testing in a multi-site environment.

Original languageEnglish (US)
Title of host publicationProceedings - 2012 17th IEEE European Test Symposium, ETS 2012
DOIs
StatePublished - Aug 13 2012
Event2012 17th IEEE European Test Symposium, ETS 2012 - Annecy, France
Duration: May 28 2012Jun 1 2012

Publication series

NameProceedings - 2012 17th IEEE European Test Symposium, ETS 2012

Other

Other2012 17th IEEE European Test Symposium, ETS 2012
CountryFrance
CityAnnecy
Period5/28/126/1/12

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Adaptive multi-site testing for analog/mixed-signal circuits incorporating neighborhood information'. Together they form a unique fingerprint.

  • Cite this

    Yilmaz, E., & Ozev, S. (2012). Adaptive multi-site testing for analog/mixed-signal circuits incorporating neighborhood information. In Proceedings - 2012 17th IEEE European Test Symposium, ETS 2012 [6233010] (Proceedings - 2012 17th IEEE European Test Symposium, ETS 2012). https://doi.org/10.1109/ETS.2012.6233010