@inproceedings{2a2f31fd030a48689a82ddbc0ba8d492,
title = "Activation Energy Determination for Photovoltaic Encapsulant Discoloration by Indoor Accelerated UV Testing",
abstract = "A novel methodology for determining the activation energy of photovoltaic encapsulant discoloration using an indoor accelerated ultraviolet (UV) stress test while simultaneously maintaining multiple module temperatures in a single weathering chamber is presented. The testing was performed on some fresh mini-modules with a glass/EVA/cell/EVA/backsheet construction. The short-circuit current degradation from individual cells was used to quantify transmittance losses due to discoloration. Activation energy determined using indoor accelerated UV test data and Modified Arrhenius model ranges from 26 to 44 kJ/mol (0.27 to 0.46 eV). Activation energy was also determined from the outdoor field degradation data by employing different physical models that consider the individual or combined effects of key environmental factors. The approach here is instrumental to evaluating the reliability studies on encapsulant degradation mechanisms using relatively less time and resources.",
keywords = "Arrhenius model, accelerated testing, activation energy, degradation, encapsulant discoloration, photovoltaic module",
author = "Archana Sinha and Deepak Kumar and Michael Kempe and Dirk Jordan and {Tamizh Mani}, {Govinda Samy}",
note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018 ; Conference date: 10-06-2018 Through 15-06-2018",
year = "2018",
month = nov,
day = "26",
doi = "10.1109/PVSC.2018.8547726",
language = "English (US)",
series = "2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1336--1341",
booktitle = "2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC",
}