Achieving atomic resolution

Research output: Contribution to journalReview article

3 Scopus citations

Abstract

Different aspects and uses of high resolution electron microscopy (HREM) are reviewed to study defect structures in the bulk when atomic resolution is needed. HREM has been used to determine the atomic structure of line and planar defects and interfaces. The importance of intergranular phases in creamics and at metal-ceramic interfaces has been realized. The SrTiO3/BaTiO 3 interfaces have been analyzed by using HREM. MBE-grown Nb-sapphire interface structure can be determined by HREM. The lattice image of GaAs, recorded at 200 kV using a Philips HREM instrument fitted with spherical aberration corrector is also shown. HREM can solved materials science problems by providing an explanation for bulk properties at the atomic level.

Original languageEnglish (US)
Pages (from-to)20-33
Number of pages14
JournalMaterials Today
Volume5
Issue number3
DOIs
StatePublished - Jan 1 2002

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ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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