Achievement of atomic resolution electron microscopy

Research output: Contribution to journalArticle

5 Scopus citations

Abstract

Atomic‐level details are easily resolved in the latest generation of intermediate voltage electron microscopes, but structural information on the same scale can only be extracted under certain specific conditions. Some understanding of imaging theory, as well as an awareness of correct operating conditions, is required for reliable image interpretation. Several representative examples are chosen to illustrate the possibilities for atomic‐resolution imaging of materials, and perspectives and outlook for the technique are briefly discussed.

Original languageEnglish (US)
Pages (from-to)11-23
Number of pages13
JournalJournal of electron microscopy technique
Volume12
Issue number1
DOIs
StatePublished - May 1989

Keywords

  • Atomic‐resolution
  • Intermediate voltage

ASJC Scopus subject areas

  • Anatomy

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