Accurate structure-factor phase determination by electron diffraction in noncentrosymmetric crystals

J. M. Zuo, John Spence, R. Hoier

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Abstract

A solution to the phase problem is described which gives the phase invariant =2h-g for electron structure factors with phases h and g in noncentric crystals. The method exploits the high-voltage dependence of a minimum in convergent-beam transmission-electron-diffraction patterns in the systematics three-beam geometry. For CdS, with h=(002) and g=(004) we find =54.4°+0.9°. The error in the derived (002) x-ray structure-factor phase is 0.069°. The method is accurate enough to provide information on the bonding charge distribution in noncentric crystals.

Original languageEnglish (US)
Pages (from-to)547-550
Number of pages4
JournalPhysical Review Letters
Volume62
Issue number5
DOIs
StatePublished - Jan 1 1989

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ASJC Scopus subject areas

  • Physics and Astronomy(all)

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