Accurate cross sections for microanalysis

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

To calculate the intensity of x-ray emission in electron beam microanalysis requires a knowledge of the energy distribution of the electrons in the solid, the energy variation of the ionization cross section of the relevant subshell, the fraction of ionizations events producing x rays of interest and the absorption coefficient of the x rays on the path to the detector. The theoretical predictions and experimental data available for ionization cross sections are limited mainly to K shells of a few elements. Results of systematic plane wave Born approximation calculations with exchange for K, L, and M shell ionization cross sections over the range of electron energies used in microanalysis are presented. Comparisons are made with experimental measurement for selected K shells and it is shown that the plane wave theory is not appropriate for overvoltages less than 2.5 V.

Original languageEnglish (US)
Pages (from-to)487-495
Number of pages9
JournalJournal of Research of the National Institute of Standards and Technology
Volume107
Issue number6
StatePublished - Nov 2002

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Microanalysis
Ionization
X rays
Born approximation
Electrons
Electron beams
Ion exchange
Detectors

Keywords

  • Electron beam x-ray microanalysis
  • Electron ionization cross sections
  • Microanalysis
  • X-ray microanalysis

ASJC Scopus subject areas

  • General
  • Engineering (miscellaneous)

Cite this

Accurate cross sections for microanalysis. / Rez, Peter.

In: Journal of Research of the National Institute of Standards and Technology, Vol. 107, No. 6, 11.2002, p. 487-495.

Research output: Contribution to journalArticle

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