Accelerated testing of module-level power electronics for long-term reliability

Jack Flicker, Govindasamy Tamizhmani, Mathan Kumar Moorthy, Ramanathan Thiagarajan, Raja Ayyanar

Research output: Contribution to journalArticlepeer-review

15 Scopus citations

Fingerprint

Dive into the research topics of 'Accelerated testing of module-level power electronics for long-term reliability'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds

Physics & Astronomy