Accelerated testing of module level power electronics for long-term reliability

Jack Flicker, Govindasamy Tamizhmani, Mathan Kumar Moorthy, Ramanathan Thiagarajan, Raja Ayyanar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This work has applied a suite of long-term reliability ATs (accelerated tests) to a variety of MLPE devices (module level power electronics such as microinverters and optimizers) from five different manufacturers. This data set is one of first (only [3] is reported for reliability testing in the literature) as well as the largest experimental set in public literature, both in sample size (5 manufacturers including both DC/DC and DC/AC units and 20 units for each test) as well as number of experiments (6 different experimental test conditions) for MLPE devices. The accelerated stress tests include thermal cycling test per IEC 61215 profile, and damp heat test per IEC 61215 profile and they were performed under powered and unpowered conditions. Included in these experiments are the first independent long-term experimental data regarding damp heat as well as the longest term (>9 month) testing of MLPE units reported in literature for thermal cycling. Additionally, this work is the first to show in situ power measurements as well as periodic efficiency measurements over length of experimental tests, demonstrating whether certain tests result in long-term degradation or immediate catastrophic failures. The result of this testing demonstrates the long-term durability and reliability of MLPE units to several accelerated environmental stressors.

Original languageEnglish (US)
Title of host publication2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-6
Number of pages6
ISBN (Electronic)9781509056057
DOIs
StatePublished - May 25 2018
Event44th IEEE Photovoltaic Specialist Conference, PVSC 2017 - Washington, United States
Duration: Jun 25 2017Jun 30 2017

Other

Other44th IEEE Photovoltaic Specialist Conference, PVSC 2017
CountryUnited States
CityWashington
Period6/25/176/30/17

Fingerprint

Power electronics
Thermal cycling
Testing
Durability
Experiments
Degradation
Hot Temperature

Keywords

  • Accelerated life test
  • Microinverter
  • MLPE
  • Module level power electronics
  • Optimizer
  • Photovoltaics
  • Reliability

ASJC Scopus subject areas

  • Renewable Energy, Sustainability and the Environment
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Flicker, J., Tamizhmani, G., Moorthy, M. K., Thiagarajan, R., & Ayyanar, R. (2018). Accelerated testing of module level power electronics for long-term reliability. In 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017 (pp. 1-6). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2017.8366251

Accelerated testing of module level power electronics for long-term reliability. / Flicker, Jack; Tamizhmani, Govindasamy; Moorthy, Mathan Kumar; Thiagarajan, Ramanathan; Ayyanar, Raja.

2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc., 2018. p. 1-6.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Flicker, J, Tamizhmani, G, Moorthy, MK, Thiagarajan, R & Ayyanar, R 2018, Accelerated testing of module level power electronics for long-term reliability. in 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc., pp. 1-6, 44th IEEE Photovoltaic Specialist Conference, PVSC 2017, Washington, United States, 6/25/17. https://doi.org/10.1109/PVSC.2017.8366251
Flicker J, Tamizhmani G, Moorthy MK, Thiagarajan R, Ayyanar R. Accelerated testing of module level power electronics for long-term reliability. In 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc. 2018. p. 1-6 https://doi.org/10.1109/PVSC.2017.8366251
Flicker, Jack ; Tamizhmani, Govindasamy ; Moorthy, Mathan Kumar ; Thiagarajan, Ramanathan ; Ayyanar, Raja. / Accelerated testing of module level power electronics for long-term reliability. 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 1-6
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