Accelerated irradiation method to study synergy sffects in bipolar integrated circuits

Nicolas Jean Henri Roche, Yago Gonzalez Velo, Laurent Dusseau, Jérôme Boch, Jean Roch Vaillé, Frédéric Saigné, Bruno Azais, Gérard Auriel, Eric Lorfèvre, Vincent Pouget, Stephen P. Buchner, Jean Pierre David, Ronan Marec, Philippe Calvel

Research output: Contribution to journalArticle

20 Scopus citations

Abstract

An accelerated irradiation technique is used to study dose-ASET synergy effects. The impact of TID on SET is found to be identical when the dose rate is switched from high to low or from low to high.

Original languageEnglish (US)
Article number5204685
Pages (from-to)1971-1977
Number of pages7
JournalIEEE Transactions on Nuclear Science
Volume56
Issue number4
DOIs
StatePublished - Aug 1 2009

Keywords

  • Analog single event transient
  • Bipolar analog integrated circuits
  • Pulsed-laser testing
  • Total ionizing dose

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

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    Roche, N. J. H., Gonzalez Velo, Y., Dusseau, L., Boch, J., Vaillé, J. R., Saigné, F., Azais, B., Auriel, G., Lorfèvre, E., Pouget, V., Buchner, S. P., David, J. P., Marec, R., & Calvel, P. (2009). Accelerated irradiation method to study synergy sffects in bipolar integrated circuits. IEEE Transactions on Nuclear Science, 56(4), 1971-1977. [5204685]. https://doi.org/10.1109/TNS.2009.2015313