Aberration-corrected imaging of active sites on industrial catalyst nanoparticles

Lionel Cervera Gontard, Lan Yun Chang, Crispin J.D. Hetherington, Angus I. Kirkland, Dogan Ozkaya, Rafal E. Dunin-Borkowski

Research output: Contribution to journalArticle

101 Scopus citations

Abstract

Picture perfect: Information about the local topologies of active sites on commercial nanoparticles can be gained with atomic resolution through spherical-aberration-corrected transmission electron microscopy (TEM). A powder of Pt nanoparticles on carbon black was examined with two advanced TEM techniques based on recent developments in hardware (aberration correction) and computation (exit wavefunction restoration). (Figure Presented).

Original languageEnglish (US)
Pages (from-to)3683-3685
Number of pages3
JournalAngewandte Chemie - International Edition
Volume46
Issue number20
DOIs
StatePublished - Jul 2 2007
Externally publishedYes

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Keywords

  • Active sites
  • Electron microscopy
  • Heterogeneous catalysis
  • Nanoparticles
  • Platinum

ASJC Scopus subject areas

  • Catalysis
  • Chemistry(all)

Cite this

Gontard, L. C., Chang, L. Y., Hetherington, C. J. D., Kirkland, A. I., Ozkaya, D., & Dunin-Borkowski, R. E. (2007). Aberration-corrected imaging of active sites on industrial catalyst nanoparticles. Angewandte Chemie - International Edition, 46(20), 3683-3685. https://doi.org/10.1002/anie.200604811