Aberration-corrected imaging of active sites on industrial catalyst nanoparticles

Lionel Cervera Gontard, Lan-Yun Chang, Crispin J D Hetherington, Angus I. Kirkland, Dogan Ozkaya, Rafal E. Dunin-Borkowski

Research output: Contribution to journalArticle

100 Citations (Scopus)

Abstract

Picture perfect: Information about the local topologies of active sites on commercial nanoparticles can be gained with atomic resolution through spherical-aberration-corrected transmission electron microscopy (TEM). A powder of Pt nanoparticles on carbon black was examined with two advanced TEM techniques based on recent developments in hardware (aberration correction) and computation (exit wavefunction restoration). (Figure Presented).

Original languageEnglish (US)
Pages (from-to)3683-3685
Number of pages3
JournalAngewandte Chemie - International Edition
Volume46
Issue number20
DOIs
StatePublished - Jul 2 2007
Externally publishedYes

Fingerprint

Aberrations
Nanoparticles
Transmission electron microscopy
Soot
Imaging techniques
Catalysts
Wave functions
Carbon black
Powders
Restoration
Topology
Hardware

Keywords

  • Active sites
  • Electron microscopy
  • Heterogeneous catalysis
  • Nanoparticles
  • Platinum

ASJC Scopus subject areas

  • Chemistry(all)

Cite this

Gontard, L. C., Chang, L-Y., Hetherington, C. J. D., Kirkland, A. I., Ozkaya, D., & Dunin-Borkowski, R. E. (2007). Aberration-corrected imaging of active sites on industrial catalyst nanoparticles. Angewandte Chemie - International Edition, 46(20), 3683-3685. https://doi.org/10.1002/anie.200604811

Aberration-corrected imaging of active sites on industrial catalyst nanoparticles. / Gontard, Lionel Cervera; Chang, Lan-Yun; Hetherington, Crispin J D; Kirkland, Angus I.; Ozkaya, Dogan; Dunin-Borkowski, Rafal E.

In: Angewandte Chemie - International Edition, Vol. 46, No. 20, 02.07.2007, p. 3683-3685.

Research output: Contribution to journalArticle

Gontard, LC, Chang, L-Y, Hetherington, CJD, Kirkland, AI, Ozkaya, D & Dunin-Borkowski, RE 2007, 'Aberration-corrected imaging of active sites on industrial catalyst nanoparticles', Angewandte Chemie - International Edition, vol. 46, no. 20, pp. 3683-3685. https://doi.org/10.1002/anie.200604811
Gontard, Lionel Cervera ; Chang, Lan-Yun ; Hetherington, Crispin J D ; Kirkland, Angus I. ; Ozkaya, Dogan ; Dunin-Borkowski, Rafal E. / Aberration-corrected imaging of active sites on industrial catalyst nanoparticles. In: Angewandte Chemie - International Edition. 2007 ; Vol. 46, No. 20. pp. 3683-3685.
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