Aberration-corrected imaging of active sites on industrial catalyst nanoparticles

Lionel Cervera Gontard; Lan Yun Chang; Crispin J.D. Hetherington; Angus I. Kirkland; Dogan Ozkaya; Rafal E. Dunin-Borkowski

doi:10.1002/anie.200604811

Aberration-corrected imaging of active sites on industrial catalyst nanoparticles

Lionel Cervera Gontard, Lan Yun Chang, Crispin J.D. Hetherington, Angus I. Kirkland, Dogan Ozkaya, Rafal E. Dunin-Borkowski

Research output: Contribution to journal › Article › peer-review

115 Scopus citations

Abstract

Picture perfect: Information about the local topologies of active sites on commercial nanoparticles can be gained with atomic resolution through spherical-aberration-corrected transmission electron microscopy (TEM). A powder of Pt nanoparticles on carbon black was examined with two advanced TEM techniques based on recent developments in hardware (aberration correction) and computation (exit wavefunction restoration). (Figure Presented).

Original language	English (US)
Pages (from-to)	3683-3685
Number of pages	3
Journal	Angewandte Chemie - International Edition
Volume	46
Issue number	20
DOIs	https://doi.org/10.1002/anie.200604811
State	Published - 2007
Externally published	Yes

Keywords

Active sites
Electron microscopy
Heterogeneous catalysis
Nanoparticles
Platinum

ASJC Scopus subject areas

Catalysis
Chemistry(all)

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10.1002/anie.200604811

Cite this

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title = "Aberration-corrected imaging of active sites on industrial catalyst nanoparticles",

abstract = "Picture perfect: Information about the local topologies of active sites on commercial nanoparticles can be gained with atomic resolution through spherical-aberration-corrected transmission electron microscopy (TEM). A powder of Pt nanoparticles on carbon black was examined with two advanced TEM techniques based on recent developments in hardware (aberration correction) and computation (exit wavefunction restoration). (Figure Presented).",

keywords = "Active sites, Electron microscopy, Heterogeneous catalysis, Nanoparticles, Platinum",

author = "Gontard, {Lionel Cervera} and Chang, {Lan Yun} and Hetherington, {Crispin J.D.} and Kirkland, {Angus I.} and Dogan Ozkaya and Dunin-Borkowski, {Rafal E.}",

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T1 - Aberration-corrected imaging of active sites on industrial catalyst nanoparticles

AU - Gontard, Lionel Cervera

AU - Chang, Lan Yun

AU - Hetherington, Crispin J.D.

AU - Kirkland, Angus I.

AU - Ozkaya, Dogan

AU - Dunin-Borkowski, Rafal E.

PY - 2007

Y1 - 2007

N2 - Picture perfect: Information about the local topologies of active sites on commercial nanoparticles can be gained with atomic resolution through spherical-aberration-corrected transmission electron microscopy (TEM). A powder of Pt nanoparticles on carbon black was examined with two advanced TEM techniques based on recent developments in hardware (aberration correction) and computation (exit wavefunction restoration). (Figure Presented).

AB - Picture perfect: Information about the local topologies of active sites on commercial nanoparticles can be gained with atomic resolution through spherical-aberration-corrected transmission electron microscopy (TEM). A powder of Pt nanoparticles on carbon black was examined with two advanced TEM techniques based on recent developments in hardware (aberration correction) and computation (exit wavefunction restoration). (Figure Presented).

KW - Active sites

KW - Electron microscopy

KW - Heterogeneous catalysis

KW - Nanoparticles

KW - Platinum

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JO - Angewandte Chemie - International Edition

JF - Angewandte Chemie - International Edition

IS - 20

ER -

Aberration-corrected imaging of active sites on industrial catalyst nanoparticles

Abstract

Keywords

ASJC Scopus subject areas

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