A Tunable Measure for Information Leakage

Jiachun Liao, Oliver Kosut, Lalitha Sankar, Flavio P. Calmon

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

A tunable measure for information leakage called maximal a-leakage is introduced. This measure quantifies the maximal gain of an adversary in refining a tilted version of its prior belief of any (potentially random) function of a dataset conditioning on a disclosed dataset. The choice of \alpha determines the specific adversarial action ranging from refining a belief for \alpha=1 to guessing the best posterior for \alpha=\infty, and for these extremal values this measure simplifies to mutual information (MI) and maximal leakage (MaxL), respectively. For all other \alpha this measure is shown to be the Arimoto channel capacity. Several properties of this measure are proven including: (i) quasi-convexity in the mapping between the original and disclosed datasets; (ii) data processing inequalities; and (iii) a composition property. A full version of this paper is in [1].

Original languageEnglish (US)
Title of host publication2018 IEEE International Symposium on Information Theory, ISIT 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages701-705
Number of pages5
Volume2018-June
ISBN (Print)9781538647806
DOIs
StatePublished - Aug 15 2018
Event2018 IEEE International Symposium on Information Theory, ISIT 2018 - Vail, United States
Duration: Jun 17 2018Jun 22 2018

Other

Other2018 IEEE International Symposium on Information Theory, ISIT 2018
CountryUnited States
CityVail
Period6/17/186/22/18

ASJC Scopus subject areas

  • Theoretical Computer Science
  • Information Systems
  • Modeling and Simulation
  • Applied Mathematics

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  • Cite this

    Liao, J., Kosut, O., Sankar, L., & Calmon, F. P. (2018). A Tunable Measure for Information Leakage. In 2018 IEEE International Symposium on Information Theory, ISIT 2018 (Vol. 2018-June, pp. 701-705). [8437307] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISIT.2018.8437307