@inproceedings{eca8875f777c4ca7aa70a92870834293,
title = "A TDC-based test platform for dynamic circuit aging characterization",
abstract = "An on-chip 45nm test platform that directly monitors circuit performance degradation during dynamic operation is demonstrated. In contrast to traditional ring-oscillator (RO) based frequency measurements, it utilizes a Time-to-Digital Converter (TDC) with 2ps resolution to efficiently monitor circuit delay change on-the-fly. This new technique allows the capability of measuring signal edge degradation under various realistic circuit operating scenarios, such as asymmetric aging, dynamic voltage/frequency scaling, dynamic duty cycle factors, and temperature variations.",
keywords = "NBTI, RO, TDC, asymetric aging, duty cycle, relibility, test structure, variations",
author = "Min Chen and Vijay Reddy and John Carulli and Srikanth Krishnan and Vijay Rentala and Venkatesh Srinivasan and Yu Cao",
year = "2011",
month = jun,
day = "23",
doi = "10.1109/IRPS.2011.5784448",
language = "English (US)",
isbn = "9781424491117",
series = "IEEE International Reliability Physics Symposium Proceedings",
pages = "2B.2.1--2B.2.5",
booktitle = "2011 International Reliability Physics Symposium, IRPS 2011",
note = "49th International Reliability Physics Symposium, IRPS 2011 ; Conference date: 10-04-2011 Through 14-04-2011",
}