Abstract
Medium frequency transformer (MFT) is considered to be the key element in a solid state transformer (SST). Compared to the conventional line-frequency transformer, the MFT has much reduced volume and weight. However, the MFT suffers from higher core loss due to its medium operating frequency. Normally, the MFT core loss is experimentally measured by open-circuit test, when the magnetizing voltage and magnetizing current are measurable. Whenever the MFT is not open-circuited, the direct in-circuit core loss measurement is impractical. In this paper, a simple technique is proposed to achieve the in-circuit core loss measurement for the MFT under arbitrary excitation voltage waveforms and various load conditions. The operating principle and key steps of the proposed measurement are explained in details. The accuracy of the proposed measurement technique is verified by a resistive load experimental test under both sinusoidal and non-sinusoidal excitation voltages.
| Original language | English (US) |
|---|---|
| Title of host publication | 34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 2372-2376 |
| Number of pages | 5 |
| ISBN (Electronic) | 9781538683309 |
| DOIs | |
| State | Published - May 24 2019 |
| Event | 34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019 - Anaheim, United States Duration: Mar 17 2019 → Mar 21 2019 |
Publication series
| Name | Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC |
|---|---|
| Volume | 2019-March |
Conference
| Conference | 34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019 |
|---|---|
| Country | United States |
| City | Anaheim |
| Period | 3/17/19 → 3/21/19 |
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ASJC Scopus subject areas
- Electrical and Electronic Engineering
Cite this
A simple technique for In-circuit core loss measurement of medium frequency transformer. / Zhang, Zhengda; Zhang, Lei; Qin, Jiangchao.
34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019. Institute of Electrical and Electronics Engineers Inc., 2019. p. 2372-2376 8721933 (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC; Vol. 2019-March).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - A simple technique for In-circuit core loss measurement of medium frequency transformer
AU - Zhang, Zhengda
AU - Zhang, Lei
AU - Qin, Jiangchao
PY - 2019/5/24
Y1 - 2019/5/24
N2 - Medium frequency transformer (MFT) is considered to be the key element in a solid state transformer (SST). Compared to the conventional line-frequency transformer, the MFT has much reduced volume and weight. However, the MFT suffers from higher core loss due to its medium operating frequency. Normally, the MFT core loss is experimentally measured by open-circuit test, when the magnetizing voltage and magnetizing current are measurable. Whenever the MFT is not open-circuited, the direct in-circuit core loss measurement is impractical. In this paper, a simple technique is proposed to achieve the in-circuit core loss measurement for the MFT under arbitrary excitation voltage waveforms and various load conditions. The operating principle and key steps of the proposed measurement are explained in details. The accuracy of the proposed measurement technique is verified by a resistive load experimental test under both sinusoidal and non-sinusoidal excitation voltages.
AB - Medium frequency transformer (MFT) is considered to be the key element in a solid state transformer (SST). Compared to the conventional line-frequency transformer, the MFT has much reduced volume and weight. However, the MFT suffers from higher core loss due to its medium operating frequency. Normally, the MFT core loss is experimentally measured by open-circuit test, when the magnetizing voltage and magnetizing current are measurable. Whenever the MFT is not open-circuited, the direct in-circuit core loss measurement is impractical. In this paper, a simple technique is proposed to achieve the in-circuit core loss measurement for the MFT under arbitrary excitation voltage waveforms and various load conditions. The operating principle and key steps of the proposed measurement are explained in details. The accuracy of the proposed measurement technique is verified by a resistive load experimental test under both sinusoidal and non-sinusoidal excitation voltages.
UR - http://www.scopus.com/inward/record.url?scp=85067131728&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85067131728&partnerID=8YFLogxK
U2 - 10.1109/APEC.2019.8721933
DO - 10.1109/APEC.2019.8721933
M3 - Conference contribution
AN - SCOPUS:85067131728
T3 - Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
SP - 2372
EP - 2376
BT - 34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019
PB - Institute of Electrical and Electronics Engineers Inc.
ER -