A simple technique for In-circuit core loss measurement of medium frequency transformer

Zhengda Zhang, Lei Zhang, Jiangchao Qin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Medium frequency transformer (MFT) is considered to be the key element in a solid state transformer (SST). Compared to the conventional line-frequency transformer, the MFT has much reduced volume and weight. However, the MFT suffers from higher core loss due to its medium operating frequency. Normally, the MFT core loss is experimentally measured by open-circuit test, when the magnetizing voltage and magnetizing current are measurable. Whenever the MFT is not open-circuited, the direct in-circuit core loss measurement is impractical. In this paper, a simple technique is proposed to achieve the in-circuit core loss measurement for the MFT under arbitrary excitation voltage waveforms and various load conditions. The operating principle and key steps of the proposed measurement are explained in details. The accuracy of the proposed measurement technique is verified by a resistive load experimental test under both sinusoidal and non-sinusoidal excitation voltages.

Original languageEnglish (US)
Title of host publication34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2372-2376
Number of pages5
ISBN (Electronic)9781538683309
DOIs
StatePublished - May 24 2019
Event34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019 - Anaheim, United States
Duration: Mar 17 2019Mar 21 2019

Publication series

NameConference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
Volume2019-March

Conference

Conference34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019
CountryUnited States
CityAnaheim
Period3/17/193/21/19

Fingerprint

Networks (circuits)
Electric potential

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Zhang, Z., Zhang, L., & Qin, J. (2019). A simple technique for In-circuit core loss measurement of medium frequency transformer. In 34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019 (pp. 2372-2376). [8721933] (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC; Vol. 2019-March). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APEC.2019.8721933

A simple technique for In-circuit core loss measurement of medium frequency transformer. / Zhang, Zhengda; Zhang, Lei; Qin, Jiangchao.

34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019. Institute of Electrical and Electronics Engineers Inc., 2019. p. 2372-2376 8721933 (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC; Vol. 2019-March).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Zhang, Z, Zhang, L & Qin, J 2019, A simple technique for In-circuit core loss measurement of medium frequency transformer. in 34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019., 8721933, Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC, vol. 2019-March, Institute of Electrical and Electronics Engineers Inc., pp. 2372-2376, 34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019, Anaheim, United States, 3/17/19. https://doi.org/10.1109/APEC.2019.8721933
Zhang Z, Zhang L, Qin J. A simple technique for In-circuit core loss measurement of medium frequency transformer. In 34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019. Institute of Electrical and Electronics Engineers Inc. 2019. p. 2372-2376. 8721933. (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC). https://doi.org/10.1109/APEC.2019.8721933
Zhang, Zhengda ; Zhang, Lei ; Qin, Jiangchao. / A simple technique for In-circuit core loss measurement of medium frequency transformer. 34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019. Institute of Electrical and Electronics Engineers Inc., 2019. pp. 2372-2376 (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC).
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