A simple electronic aperture for rastered-beam depth profiles

Peter Williams, Charles A. Evans

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

A simple, inexpensive electronic aperture for use in depth profiling with ion microprobes and ion-scattering spectrometers is described. The system derives a gate signal from a photocell which views the center of an oscilloscope display driven by the ion beam raster voltages.

Original languageEnglish (US)
Pages (from-to)327-331
Number of pages5
JournalInternational Journal of Mass Spectrometry and Ion Physics
Volume22
Issue number3-4
DOIs
StatePublished - 1976
Externally publishedYes

Fingerprint

photoelectric cells
oscilloscopes
ion scattering
apertures
ion beams
Cathode ray oscilloscopes
spectrometers
Ions
Photoelectric cells
Depth profiling
electric potential
profiles
electronics
Ion beams
Spectrometers
ions
Display devices
Scattering
Electric potential

Cite this

A simple electronic aperture for rastered-beam depth profiles. / Williams, Peter; Evans, Charles A.

In: International Journal of Mass Spectrometry and Ion Physics, Vol. 22, No. 3-4, 1976, p. 327-331.

Research output: Contribution to journalArticle

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