A simple, inexpensive electronic aperture for use in depth profiling with ion microprobes and ion-scattering spectrometers is described. The system derives a gate signal from a photocell which views the center of an oscilloscope display driven by the ion beam raster voltages.
|Original language||English (US)|
|Number of pages||5|
|Journal||International Journal of Mass Spectrometry and Ion Physics|
|State||Published - Dec 1976|