A simple electronic aperture for rastered-beam depth profiles

Peter Williams, Charles A. Evans

Research output: Contribution to journalArticle

9 Scopus citations

Abstract

A simple, inexpensive electronic aperture for use in depth profiling with ion microprobes and ion-scattering spectrometers is described. The system derives a gate signal from a photocell which views the center of an oscilloscope display driven by the ion beam raster voltages.

Original languageEnglish (US)
Pages (from-to)327-331
Number of pages5
JournalInternational Journal of Mass Spectrometry and Ion Physics
Volume22
Issue number3-4
DOIs
StatePublished - Dec 1976
Externally publishedYes

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