A self-consistent event biasing scheme for statistical enhancement

M. Nedjalkov, S. Ahmed, Dragica Vasileska

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

The event biasing approach for statistical enhancement is generalized for self-consistent device simulations, posed by mixed boundary and initial conditions transport problems. It is shown that the weight of the particles, as obtained by biasing of the Boltzmann equation, survives between the successive steps of solving the Poisson equation. Particular biasing techniques are applied to the simulation of a 15 nm MOSFET and the convergence of the terminal and channel currents is analyzed.

Original languageEnglish (US)
Pages (from-to)305-309
Number of pages5
JournalJournal of Computational Electronics
Volume3
Issue number3-4
DOIs
StatePublished - Oct 2004

Keywords

  • Event biasing
  • Monte Carlo
  • Statistical enhancement

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Modeling and Simulation
  • Electrical and Electronic Engineering

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