A scanning tunneling microscope in a side-entry holder for reflection electron microscopy in the philips EM400

Research output: Contribution to journalArticle

28 Citations (Scopus)

Abstract

Design and construction details are given for a scanning tunneling microscope which fits inside a side-entry holder for transmission electron microscopes, operated in the reflection mode. The instrument is intended to improve our understanding of the mechanisms of STM imaging, and to act as a prototype for the development of an ultra-high vacuum instrument.

Original languageEnglish (US)
Pages (from-to)165-169
Number of pages5
JournalUltramicroscopy
Volume25
Issue number2
DOIs
StatePublished - 1988

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holders
entry
Electron microscopy
electron microscopy
Microscopes
microscopes
Scanning
scanning
Ultrahigh vacuum
ultrahigh vacuum
Electron microscopes
electron microscopes
prototypes
Imaging techniques

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation

Cite this

A scanning tunneling microscope in a side-entry holder for reflection electron microscopy in the philips EM400. / Spence, John.

In: Ultramicroscopy, Vol. 25, No. 2, 1988, p. 165-169.

Research output: Contribution to journalArticle

@article{5083921b12504b1da8b6b9b74c71b724,
title = "A scanning tunneling microscope in a side-entry holder for reflection electron microscopy in the philips EM400",
abstract = "Design and construction details are given for a scanning tunneling microscope which fits inside a side-entry holder for transmission electron microscopes, operated in the reflection mode. The instrument is intended to improve our understanding of the mechanisms of STM imaging, and to act as a prototype for the development of an ultra-high vacuum instrument.",
author = "John Spence",
year = "1988",
doi = "10.1016/0304-3991(88)90224-0",
language = "English (US)",
volume = "25",
pages = "165--169",
journal = "Ultramicroscopy",
issn = "0304-3991",
publisher = "Elsevier",
number = "2",

}

TY - JOUR

T1 - A scanning tunneling microscope in a side-entry holder for reflection electron microscopy in the philips EM400

AU - Spence, John

PY - 1988

Y1 - 1988

N2 - Design and construction details are given for a scanning tunneling microscope which fits inside a side-entry holder for transmission electron microscopes, operated in the reflection mode. The instrument is intended to improve our understanding of the mechanisms of STM imaging, and to act as a prototype for the development of an ultra-high vacuum instrument.

AB - Design and construction details are given for a scanning tunneling microscope which fits inside a side-entry holder for transmission electron microscopes, operated in the reflection mode. The instrument is intended to improve our understanding of the mechanisms of STM imaging, and to act as a prototype for the development of an ultra-high vacuum instrument.

UR - http://www.scopus.com/inward/record.url?scp=0023580985&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0023580985&partnerID=8YFLogxK

U2 - 10.1016/0304-3991(88)90224-0

DO - 10.1016/0304-3991(88)90224-0

M3 - Article

AN - SCOPUS:0023580985

VL - 25

SP - 165

EP - 169

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

IS - 2

ER -