A scanning tunneling microscope in a side-entry holder for reflection electron microscopy in the philips EM400

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Abstract

Design and construction details are given for a scanning tunneling microscope which fits inside a side-entry holder for transmission electron microscopes, operated in the reflection mode. The instrument is intended to improve our understanding of the mechanisms of STM imaging, and to act as a prototype for the development of an ultra-high vacuum instrument.

Original languageEnglish (US)
Pages (from-to)165-169
Number of pages5
JournalUltramicroscopy
Volume25
Issue number2
DOIs
StatePublished - 1988

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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