A robust, self-tuning CMOS circuit for built-in go/no-go testing of synthesizer phase noise

Erdem S. Erdogan, Sule Ozev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

As one way of reducing the reliance on mixed signal testers for circuits with small analog content, researchers have proposed built-in self-test (BiST) techniques that target specific parameters of analog circuits. Most BiST techniques for phase locked loops (PLL) aim at measuring the timing jitter through precise on-chip clocks and/or additional computation of measured specs. In this paper, we propose a built-in test circuit to perform go/no-go testing for in-band PLL phase noise. Our circuit measures the band-limited, low frequency noise power at the input of the voltage controlled oscillator (VCO) which is translated as the high frequency phase noise at the output of the PLL. Our circuit contains a self calibration sequence based on a simple sinusoidal input to make it robust to process variations. The circuit is implemented using 0.8μm CMOS process with the equivalent area of roughly 800 2-input minimum size NAND gates. Monte Carlo simulations have confirmed that the test circuit can robustly detect noise levels that are above the specified fail level.

Original languageEnglish (US)
Title of host publicationProceedings - International Test Conference
DOIs
StatePublished - 2007
Externally publishedYes
Event2006 IEEE International Test Conference, ITC - Santa Clara, CA, United States
Duration: Oct 22 2006Oct 27 2006

Other

Other2006 IEEE International Test Conference, ITC
CountryUnited States
CitySanta Clara, CA
Period10/22/0610/27/06

Fingerprint

Phase noise
Tuning
Networks (circuits)
Testing
Phase locked loops
Built-in self test
Timing jitter
Variable frequency oscillators
Analog circuits
Clocks
Calibration

ASJC Scopus subject areas

  • Engineering(all)

Cite this

A robust, self-tuning CMOS circuit for built-in go/no-go testing of synthesizer phase noise. / Erdogan, Erdem S.; Ozev, Sule.

Proceedings - International Test Conference. 2007. 4079374.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Erdogan, ES & Ozev, S 2007, A robust, self-tuning CMOS circuit for built-in go/no-go testing of synthesizer phase noise. in Proceedings - International Test Conference., 4079374, 2006 IEEE International Test Conference, ITC, Santa Clara, CA, United States, 10/22/06. https://doi.org/10.1109/TEST.2006.297696
Erdogan, Erdem S. ; Ozev, Sule. / A robust, self-tuning CMOS circuit for built-in go/no-go testing of synthesizer phase noise. Proceedings - International Test Conference. 2007.
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